二手 CAMBRIDGE S 200 #9034861 待售

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CAMBRIDGE S 200
已售出
ID: 9034861
SEM Windows 7 upgrade Scanning system DISS 5 standard edition/communication USB 2.0 Hardware: X-/Y-scan, 2 analog signal inputs without counter inputs Software: without mapping and enlarged point measurement/line scan 19" rack (containing the electronics), 10 HU without housing, without desk Backplane and power logic with interlock system Central USB 2.0 interface for control and communication Plug-in card with 8 bipolar current sources (Beam alignment, image shift, stigmator) Plug-in card with X-/Y-scanning power amplifier / current sources (Magnification coarse/fine, scan rotation, tilt correction X/Y filament image) Plug-in card for objective and 2 condensor lenses / power current sources (focus coarse, fine, spot size) Plug-in card with 8 analog unipolar/bipolar control outputs /voltage (gun: HV, filament emission, SE: contrast, brightness, grid; aux: contrast brightness) 2.9. Power supplies for electronics, lenses and coils SE-amplifier module (Amplifier with offset; adjustable 1,5 kV for PMT, power supply SE-preamp SE-high voltage module (10-12 kV scintillator-high voltage and adjustable grid voltage Control module for gun-high voltage of SEM (Control of HV, filament, emission, emission current measurement, optional: power supply) Adaption of the vacuum and HV interlock of the SEM to the interlock-system of the SEM-upgrade (Vacuum-gun-HV-interlock; Stage SE-HV-interlock) 19" rack fitting in the SEM housing Schottky Thermal Field Emission (TFE) source Point-to-point Resolution of <3nm* High Beam Current. (10pA to >100na) Improved low voltage (1kV) performance TFE “Schottky” Source PC controlled. Reduced Downtime and Cost of Ownership Fully reversible AND transferable upgrade Kit for variety of Tungsten (W) SEM models including JEOL, Hitachi, FEI, Zeiss and others. External and internal magnetic shielding 30 KeV Schottky Field Emission Source Mechanical Assembly: x1 Thick walled stainless steel chamber One Schottky Field Emission Gun Unit Differential pumping tube and UHV valve Internal mu-metal shield 55 I/s ion pump and power supply (optional) External mu-metal shield YPS High Voltage Power Supply: Remote high voltage supply unit with: Fibre optic link High voltage cable with Discharge Management YPS Schottky Field Emission Gun Unit: Pre-aligned™ YPS Schottky field emission module (HV-30) YPS Software Interface: USB interfaced fibre optic output to the remote YPS HV power supply Software from the system PC to controland monitor the Schottky field emission module.
CAMBRIDGE S 200是一种扫描电子显微镜(SEM),用于微小物体的成像和分析。它能够产生分辨率低至1纳米的难以置信的高分辨率图像。CAMBRIDGE S-200的主要部件包括电子源、加速柱、法拉第笼、偏转器、扫描发生器、高压电源和数字图像检测器。电子源是发射电子的细丝,然后沿着加速柱向下传播。之后,电子通过偏转器,使光束偏转到样品区域。扫描发生器在样品区域产生偏转的光束,从而可以创建样品表面的光栅图像。这些扫描完成后,将向图像检测器发送信号,将光信号转换为电信号并将其发送到显示屏。S 200具有许多功能,使其成为需要高分辨率成像和分析的应用程序的理想选择。其超高真空系统允许在极低压力下操作,确保样品不被电子束损坏。此外,它的能量滤波器有助于减少光束的变宽和产生更高分辨率的图像.它还有一个集成的图像增强系统,有助于降低噪声和增强对比度。S-200具有先进的标本级,允许标本导航和定位自动化。这样就可以在没有用户交互的情况下对样本进行成像。该级还具有可变加速度电压、样品倾斜和样品旋转等一系列特征,使其几乎适合任何成像或分析任务。CAMBRIDGE S 200具有直观的用户界面,可方便地导航、操作和控制显微镜。它还有一个先进的软件系统,提供实时跟踪、自动化和对样本图像的定量分析。这使得CAMBRIDGE S-200适合于纳米级金相、材料分析、失效分析、晶粒尺寸测量等多种应用。总体而言,S 200是一种先进的扫描电子显微镜,能够产生极高分辨率的图像。它的高级功能允许自动标本定位、直观操作和定量分析,使其成为各种应用的理想选择。
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