二手 HITACHI S-9300 #9032647 待售

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ID: 9032647
优质的: 2001
CD Scanning electron microscope, 8-12" Electron optical system: Electron gun: SCHOTTKY Emission source Electro magnetic lens: 3-Stage electromagnetic lens system with boosting voltage Objective lens: (4) Openings click stop Heated aperture is selectable / Adjustable outside the vacuum Scan coil: 2-Stage electromagnetic deflection Astigmatism correction via an 8-pole electromagnetic coil Magnification: 1000x to > 300000x Field control method: Continuously on for sample discharging at all voltages Wafer imaging ability; Entire surface of 8” (or 12”) wafer Depth of focus: >= 1.0 um at 80000x magnification Resolution: 3 nm (800V) Retarding / Boosting mode Hitachi probe tip Power: 208 V 60 Hz 6 kVA 1 Phase CD Measurement principle: Cursor and line profile measurement Optical microscope system: Image is monochrome CCD Camera Magnification is 110x Wafer imaging: X Coverage from 5 – 295 mm Y Coverage from 5 – 195 mm Notch down Field of view: 1.2 mm Accelerating voltage: 500 V to 1600 V, 10 V steps Probe current: 4~24pA Workstation: Model: HP B180L (9GB) O/S: Unix version HP-UX 10.20 Software version: 14.71 SECS / GEM Communication interface Dual XY HITACHI micro scale DSP Image processing BSE Mode functionality Multipoint measurement function Edge roughness function Automated image archiving function Wafer handling system: (2) Cassette holders / ergo flippers Convertible to 300 mm with conversion kit BRK-287006300 Water chiller unit Main unit: HV Controller Lens PS unit DEF PS Unit Laser receiver unit X-Axis laser unit Laser linear scale cover X-Axis excel precision PCB Y-Axis excel precision PCB STSensor PCB (R) STSensor PCB (R) STSensor PCB (L) Secondary electron detection: SE and BSE electrons Aperture ass'y Ion pump 1, Ion pump 2, Ion pump 3 & controller TMP1, TMP2 & controller Stage controller Display Unit: Display of SEM and OM images, GUI operation screen HP Workstation (B180L) Keyboard & Mouse FDD MO Disk drive System controller ECPU 263 Controller C-820A Controller 4500 COGNEX Controller NMEN Controller SIP Controller PSDISP Controller NSGVA Controller EOCONT Controller NOMAFC Controller STAGE EBSI100 Controller WT EBSI100 Controller EVAC EBSI100 Controller HV EBSI100 Controller AMHSIO Controller Power unit: NIP Board PS CN PCB UPS Unit Main power switch unit ION pump power supply unit Power distribution unit Transformer unit Port 1: Door case EFEM Unit: Robot ass'y Ceramic arm Prealigner Includes: Load port 1 Load port 2 WT Controller Chiller Option: Dry pump Missing parts: Display unit: SIP Board Cognex 4500 board LAN HUB unit HDD Currently de-installed 2001 vintage.
HITACHI S-9300是一种扫描电子显微镜(SEM),设计用于材料分析领域的高级应用。它提供了多种成像功能,包括高放大倍率、卓越的分辨率以及各种制作图像的方法。HITACHI S9300的电子柱能够以2.5nm的分辨率实现高达570,000 ×的天文放大倍数,从而可以深入了解传统光学显微镜无法到达的区域。因此,它能够以极高的清晰度对大小结构进行成像,非常适合进行微观分析。显微镜上装有六硼化的LaB6场发射枪(FEG)和以CS为中心的肖特基场发射枪(FE),但允许在更高放大倍率下有更高的性能。此外,它的多焦点设置允许用户在保持固定焦点的同时在任意两个放大倍数之间切换。SEM还拥有一整套探测器,包括二次电子探测器、场发射扫描电子探测器、能量色散X射线探测器、波长色散X射线探测器、单色X射线探测器和X射线荧光探测器。这种种类繁多的探测器使用户能够更容易地从他们正在检查的任何材料中获取数据。此外,SEM具有多种预编程成像模式,如反向散射电子成像(BSE)、加速电压对比度成像(AVM)、反射电子成像(REI)以及几种成像断层扫描模式。总体而言,S 9300能够以高放大倍数生成令人难以置信的详细材料图像,同时还具有多种探测器和成像模式。它的特点和功能使它成为任何希望调查材料内部运作情况的人的宝贵工具。
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