二手 SPTS Sigma FxP #9058880 待售
看起来这件物品已经卖了。检查下面的类似产品或与我们联系,我们经验丰富的团队将为您找到它。
单击可缩放
已售出
ID: 9058880
晶圆大小: 6"
PVD System, 6"
Aluminum, Ti, TiN deposition
8-Port Transport Module configured as follows:
• 150 mm wafer size
• Two Vacuum Cassette Elevators (VCE)
• Transfer Chamber with high throughput Magnatran 7B Robot
• Inligner for wafer pre-alignment
• Cooldown Station for post-process wafer cooling
• Pfeiffer TPH260 turbo pump for each VCE
• CTI Onboard 8 Cryo Pump for Transfer Chamber
Hot Soft etch (HSE) module (1):
Inductively Coupled Plasma (ICP) module for wafer heating and/or surface preparation configured with:
• Coil RF driven by AE RFX600A generator
• Platen RF bias driven by AE RFX600A generator
• Phase-locked matching
• High temperature platen
o Resistively heated
o Set temperature range 80 to 600 °C
o PID temperature controller with ±10 °C accuracy
• Gas lines
o 50 sccm MKS MFC for Ar (process)
o 300 sccm MKS MFC for Ar (backfill heat)
• Vacuum system
o CTI Onboard 8F Enhanced Cryo Pump
o MKS 50mT and 10 Torr full range Baratrons
o Inficon BAG100S Ion Gauge
o Two-position gate valve. Process chamber pressure is defined by
gas flows
Standard Aluminium deposition module (2):
DC planar magnetron sputter module for thick aluminium deposition configured with:
• 45 mm fixed target to wafer spacing
• Swept-field magnetron
• AE Pinnacle 30 kW DC Target PSU
• Praxair Al (1%Si) monoblock UFG Target fitted for standard Trikon process acceptance testing
• High temperature standard platen
o Resistively heated
o Set temperature range 50 to 400 °C
o PID temperature controller with ±10 °C accuracy
o Enhanced air cooling for thick film depositions
• Gas lines
o 100 sccm MKS MFC for Ar (process)
• Vacuum system
o CTI Onboard 8F Enhanced Cryo Pump
o MKS 50 mT and 10 T full-range Baratron gauges
o Inficon BAG100S ion gauge
o Two-position gate valve. Gas flows define process pressure.
Standard Aluminium/Ti/TiN/TiW deposition module (1):
DC planar magnetron sputter module for aluminium deposition configured also to deposit titanium, titanium nitride or titanium tungsten.
• 45 mm fixed target to wafer spacing
• Swept-field magnetron
• Slow magnetron motor for Cu-backed target operation
• AE Pinnacle 30 kW DC Target PSU
• Praxair Al (1%Si) monoblock UFG Target fitted for standard Trikon process acceptance testing
• Shutter for in-situ target cleaning
• High temperature standard platen
o Resistively heated
o Set temperature range 50 to 400 °C
o PID temperature controller with ±10 °C accuracy
o Enhanced air cooling for thick film depositions
• Platen RF bias driven by AE RFX600A generator
• Gas lines
o 300 sccm MKS MFC for Ar (process)
o 100 sccm MKS MFC for N2 (process)
• MKS Microvision IP RGA
• Vacuum system
o CTI Onboard 8F Enhanced Cryo Pump
o MKS 50mT and 10 Torr full range Baratrons
o Inficon BAG100S ion gauge
o Two-position gate valve. Gas flows define process pressure.
Cluster tool controller (CTC) and datalogging PC:
• 1 GHz Dual Pentium III with 1 Gb RAM
• 40 Gb SCSI hard drive, 3.5 inch 1.44 Mb floppy, Zip, CD ROM
• TCP/IP comms to Module Controllers
Module controllers:
• PC104-based
• Geode 300MHz with 256 Mb RAM
• Windows embedded OS with Compact Flash storage
Operator interface:
• High resolution colour touchscreen, with membrane keyboard in clean room interface panel
• Maintenance keyboard and touchscreen in grey area. System and module mimic and status displays
• Password access control to user-defined security levels
• High and low-level control of individual devices subject to interlocks and level of security access
Recipe programming:
• Multi-step, multi-chamber recipes possible, with serial, parallel and recursive wafer sequencing
• Recipe entries prompted and checked
Event monitoring:
• Alarms and events displayed and logged
• Light tower displays system status.
• Lot and wafer tracking supported
• Process and machine parameters monitored and displays continuously updated
• Process data logged to disk
Data logging:
• Captures measured values every second
• Stored by wafer number/batch id/process step
• Data displayed on GUI or can be exported to remote PC in .CSV file format for data manipulation
Operating system/software:
• Cluster Tool and Module Controllers run Windows OS
• High-level software in C++
Host computer interface:
• Fully SECS II/GEM compliant via HSMS
The system is CE marked, conforming to the following standards:
• Machine Directive 98/37/EC
• EMC Directive 89/336/EEC
• Low voltage Directive 73/23/EEC
2005 vintage.
SPTS Sigma FxP 蚀刻器/asher是一种高吞吐量、高级蚀刻和灰化解决方桉,专为低成本的25 nm以下工艺节点制造而设计。它在单个集成系统中提供原位高分辨率成像、高通量处理、反应性离子蚀刻(RIE)和原子层沉积(ALD)功能。该平台旨在满足当今领先的消费电子制造商的先进包装要求。Sigma FxP的高级蚀刻和灰化解决方桉对于涉及薄膜沉积、图样化和晶圆平面化的过程特别有利。它提供了一个易于使用的平台,与传统技术相比,以较小的剩余残留物和较少的工艺步骤,在单个步骤中将多层蚀刻到基板上。SPTS Sigma FxP具有先进的导航模块和过程控制器,以及高度先进的集成真空系统。它对工艺参数的高精度、实时监控和控制比传统的蚀刻或灰化工艺能提供更高的精度。实时数据也可用于流程优化。为了适应光刻工艺,Sigma FxP实现了设备功能的直接成像,从而改进了工艺控制和反馈。先进的光学器件允许比大多数其他蚀刻和灰化系统更高的分辨率,也可以提供更精确的3D微观结构表征。SPTS Sigma FxP平台还提供高级自动化功能,以减少用户在处理过程中的干预。两个获得专利的精密定位系统为工艺头提供了可重复和准确的移动,以提高对准精度,同时还提供了精密的负载锁定和负载端口操作,以提高吞吐量。Sigma FxP还通过其先进的基板处理系统提供了更大的灵活性。这允许用户将其基材从一个加工站移动到另一个加工站,而不会造成任何损坏或过程污染的风险。SPTS Sigma FxP专为高通量和高质量性能而设计。它提供实时的过程监控、控制和优化,从而实现比其他类似系统更高的盈利能力。其先进的成像和自动化功能在过程时间和能耗方面可节省成本。Sigma FxP非常可靠,平均故障间隔时间大于200,000小时。这使得它非常适合高级25 nm以下进程节点项目中的应用程序。
还没有评论