二手 SPTS Sigma FxP #9058880 待售

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ID: 9058880
晶圆大小: 6"
PVD System, 6" Aluminum, Ti, TiN deposition 8-Port Transport Module configured as follows: • 150 mm wafer size • Two Vacuum Cassette Elevators (VCE) • Transfer Chamber with high throughput Magnatran 7B Robot • Inligner for wafer pre-alignment • Cooldown Station for post-process wafer cooling • Pfeiffer TPH260 turbo pump for each VCE • CTI Onboard 8 Cryo Pump for Transfer Chamber Hot Soft etch (HSE) module (1): Inductively Coupled Plasma (ICP) module for wafer heating and/or surface preparation configured with: • Coil RF driven by AE RFX600A generator • Platen RF bias driven by AE RFX600A generator • Phase-locked matching • High temperature platen o Resistively heated o Set temperature range 80 to 600 °C o PID temperature controller with ±10 °C accuracy • Gas lines o 50 sccm MKS MFC for Ar (process) o 300 sccm MKS MFC for Ar (backfill heat) • Vacuum system o CTI Onboard 8F Enhanced Cryo Pump o MKS 50mT and 10 Torr full range Baratrons o Inficon BAG100S Ion Gauge o Two-position gate valve. Process chamber pressure is defined by gas flows Standard Aluminium deposition module (2): DC planar magnetron sputter module for thick aluminium deposition configured with: • 45 mm fixed target to wafer spacing • Swept-field magnetron • AE Pinnacle 30 kW DC Target PSU • Praxair Al (1%Si) monoblock UFG Target fitted for standard Trikon process acceptance testing • High temperature standard platen o Resistively heated o Set temperature range 50 to 400 °C o PID temperature controller with ±10 °C accuracy o Enhanced air cooling for thick film depositions • Gas lines o 100 sccm MKS MFC for Ar (process) • Vacuum system o CTI Onboard 8F Enhanced Cryo Pump o MKS 50 mT and 10 T full-range Baratron gauges o Inficon BAG100S ion gauge o Two-position gate valve. Gas flows define process pressure. Standard Aluminium/Ti/TiN/TiW deposition module (1): DC planar magnetron sputter module for aluminium deposition configured also to deposit titanium, titanium nitride or titanium tungsten. • 45 mm fixed target to wafer spacing • Swept-field magnetron • Slow magnetron motor for Cu-backed target operation • AE Pinnacle 30 kW DC Target PSU • Praxair Al (1%Si) monoblock UFG Target fitted for standard Trikon process acceptance testing • Shutter for in-situ target cleaning • High temperature standard platen o Resistively heated o Set temperature range 50 to 400 °C o PID temperature controller with ±10 °C accuracy o Enhanced air cooling for thick film depositions • Platen RF bias driven by AE RFX600A generator • Gas lines o 300 sccm MKS MFC for Ar (process) o 100 sccm MKS MFC for N2 (process) • MKS Microvision IP RGA • Vacuum system o CTI Onboard 8F Enhanced Cryo Pump o MKS 50mT and 10 Torr full range Baratrons o Inficon BAG100S ion gauge o Two-position gate valve. Gas flows define process pressure. Cluster tool controller (CTC) and datalogging PC: • 1 GHz Dual Pentium III with 1 Gb RAM • 40 Gb SCSI hard drive, 3.5 inch 1.44 Mb floppy, Zip, CD ROM • TCP/IP comms to Module Controllers Module controllers: • PC104-based • Geode 300MHz with 256 Mb RAM • Windows embedded OS with Compact Flash storage Operator interface: • High resolution colour touchscreen, with membrane keyboard in clean room interface panel • Maintenance keyboard and touchscreen in grey area. System and module mimic and status displays • Password access control to user-defined security levels • High and low-level control of individual devices subject to interlocks and level of security access Recipe programming: • Multi-step, multi-chamber recipes possible, with serial, parallel and recursive wafer sequencing • Recipe entries prompted and checked Event monitoring: • Alarms and events displayed and logged • Light tower displays system status. • Lot and wafer tracking supported • Process and machine parameters monitored and displays continuously updated • Process data logged to disk Data logging: • Captures measured values every second • Stored by wafer number/batch id/process step • Data displayed on GUI or can be exported to remote PC in .CSV file format for data manipulation Operating system/software: • Cluster Tool and Module Controllers run Windows OS • High-level software in C++ Host computer interface: • Fully SECS II/GEM compliant via HSMS The system is CE marked, conforming to the following standards: • Machine Directive 98/37/EC • EMC Directive 89/336/EEC • Low voltage Directive 73/23/EEC 2005 vintage.
SPTS Sigma FxP 蚀刻器/asher是一种高吞吐量、高级蚀刻和灰化解决方桉,专为低成本的25 nm以下工艺节点制造而设计。它在单个集成系统中提供原位高分辨率成像、高通量处理、反应性离子蚀刻(RIE)和原子层沉积(ALD)功能。该平台旨在满足当今领先的消费电子制造商的先进包装要求。Sigma FxP的高级蚀刻和灰化解决方桉对于涉及薄膜沉积、图样化和晶圆平面化的过程特别有利。它提供了一个易于使用的平台,与传统技术相比,以较小的剩余残留物和较少的工艺步骤,在单个步骤中将多层蚀刻到基板上。SPTS Sigma FxP具有先进的导航模块和过程控制器,以及高度先进的集成真空系统。它对工艺参数的高精度、实时监控和控制比传统的蚀刻或灰化工艺能提供更高的精度。实时数据也可用于流程优化。为了适应光刻工艺,Sigma FxP实现了设备功能的直接成像,从而改进了工艺控制和反馈。先进的光学器件允许比大多数其他蚀刻和灰化系统更高的分辨率,也可以提供更精确的3D微观结构表征。SPTS Sigma FxP平台还提供高级自动化功能,以减少用户在处理过程中的干预。两个获得专利的精密定位系统为工艺头提供了可重复和准确的移动,以提高对准精度,同时还提供了精密的负载锁定和负载端口操作,以提高吞吐量。Sigma FxP还通过其先进的基板处理系统提供了更大的灵活性。这允许用户将其基材从一个加工站移动到另一个加工站,而不会造成任何损坏或过程污染的风险。SPTS Sigma FxP专为高通量和高质量性能而设计。它提供实时的过程监控、控制和优化,从而实现比其他类似系统更高的盈利能力。其先进的成像和自动化功能在过程时间和能耗方面可节省成本。Sigma FxP非常可靠,平均故障间隔时间大于200,000小时。这使得它非常适合高级25 nm以下进程节点项目中的应用程序。
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