二手 ADVANTEST T 5335P #9178728 待售
网址复制成功!
单击可缩放
ID: 9178728
晶圆大小: 12"
优质的: 1996
Memory tester, 12"
System configuration generate
Configuration of test head
Number of test head [1,2] ...........................>[2]
Configuration of test head 1
Test head type
1.650CH
2.1300CH [1,2] .....................> [1]
Pin configuration Slot no. [33,97,41,105]
Child A ....> [33,41,97,105˙]
Child B ....> [33,41,97,105˙]
Child C ....> [33,41,97,105˙]
Child D ....> [33,41,97,105˙]
Pin configuration Option1 PIN CARD [Y,N]
Child A ....> [Yes]
Child B ....> [Yes]
Child C ....> [Yes]
Child D ....> [Yes]
Pin configuration Option2 Pin card [Y,N]
Child AB ...> [Yes]
Child CD ...> [Yes]
Bypass capacitor to 10V/16V PPS (PCON)
1. Non existent
2. Existent [1,2] ..............> [1]
Bypass capacitor to HV PPS (PCON)
1. Non existent
2. Existent [1,2] ..............> [1]
Configuration of test head 2
Test head type
1.650CH
2.1300CH [1,2] [1]
Pin configuration Slot no. [33,97,41,105]
Child A: [33,41,97,105]
Child B: [33,41,97,105]
Child C: [33,41,97,105]
Child D: [33,41,97,105]
Pin configuration Option1 pin card [Y,N]
Child A [Yes]
Child B [Yes]
Child C [Yes]
Child D [Yes]
Pin configuration Option2 pin card [Y,N]
Child AB [Yes]
Child CD [Yes]
Bypass capacitor to 10V/16V PPS (PCON)
1. Non-existent
2. Existent [1,2] [1]
Bypass capacitor to HV PPS (PCON)
1. Non-existent
2. Existent [1,2] [1]
Configuration of DPU
1'ST DPU : STN 1,2 [Y,N] [Yes]
2'ND DPU : STN 1,2 [Y,N] [Yes]
Test head 1
DC Configuration [1-16] [1-16]
10V PPS Configuration [1-32] [1-32]
16V PPS Configuration [17-32] [˙]
HV PPS Configuration [1-4] [1-4]
Test head 2
DC Configuration [1-16] [1-16]
10V PPS Configuration [1-32] [1-32]
16V PPS Configuration [17-32] [˙]
HV PPS Configuration [1-4] [1-4]
1'ST GPIB I/F Board 0.No
1.BGR-010944X01
2.BGR-010944X02
3.BGR-010944X03
4.BGR-010944X04
5.BGK-012718 [0-5] [0]
2'ND GPIB I/F Board 0.No
1.BGR-016793 (DPU I/F)
2.BGR-010944X05
3.BGK-012718X02 [0-3] [1]
DMM Type
1. TR6861
2. R6871E
3. R6551
4. R6552T [1-4] [3]
AC Frequency (Hertz) [50,60] [60]
Configuration of FM
Number of FM board [0-4] [2]
Size of FM module
1. 1M
2. 4M
3. 8M [1-3] [1]
Number of memory bank [1-2] [2]
Number of memory bank [1-4] [4]
Pattern memory [Y,N] [No]
FM Board kind
1. BGR-020816
2. BGR-020816X02 [1-2] [2]
Configuration of MRA
MRA2/3 Option [Y,N] [Yes]
MRA Option type [2,3] (2=MRA2,3=MRA3) [2]
Type of CBU Board [1,2]
(1: BGR-019267)
(2: BGR-019267X02) ....> [1]
Number of CBU Board [1,2] [2]
Type of FBM Board [1,2,3,4] (1= 2M*72BIT)
(2= 4M*72BIT)
(3= 8M*72BIT)
(4=16M*72BIT) .........> [1]
Number of FBM Board [1-4] [4]
Compression function [Y,N] [No]
Configuration of FCDC
Flash option [Y,N] [No]
SC Board kind
1. BGR-020774
2. BGR-020774X02 [1-2] [1]
End save
1996 vintage.
ADVANTEST T 5335P是一种综合性的最终测试设备,旨在快速评估当今高密度和复杂集成电路(ICs)的性能。该系统由一个包括IC测试仪、处理程序和各种测试头在内的仪器平台组成。该测试仪配备了广泛的通用和用户可编程测试程序,使用户能够轻松自信地测试各种IC。ADVANTEST T5335P测试仪具有高速数据采集能力,能够在设置测试时准确分析数据。其无维护、使用寿命长的设计有助于确保即使在高温和恶劣的环境条件下也具有可靠的性能。其用户友好的图形用户界面允许简单的操作和编程,并包括各种功能,以实现测试的安全执行。T 5335 P IC测试仪精度高,甚至能检测到IC中最小的缺陷。它的高密度测试功能使它能够处理多达1608针的IC。它的自动测试生成功能可以快速构建针对不同IC的测试,从而节省时间和金钱。而且,测试单元带有内置的安全控制机器,在测试过程中保护IC免受损坏。T5335P工具旨在测试各种IC,包括模拟IC、数字逻辑IC、MCM IC、微控制器、处理器和特定于应用程序的IC。此外,该资产还包括几个测试头,这些测试头旨在捕获电气信息并分析IC的每个引脚处的电信号。该模型还提供实时故障诊断,允许用户在测试过程中快速识别任何问题。此外,ADVANTEST T 5335 P设备提供了广泛的附加功能,以提高IC测试的效率和准确性。这包括故障模拟和模拟参数测试,以及排序、比较、打印和显示等数据分析功能。最后,该系统以ADVANTEST可靠的客户服务为后盾,使T 5335P成为测试高密度和复杂IC的理想选择。
还没有评论