二手 ADVANTEST T 5365 #162878 待售
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ID: 162878
Memory test system
Configuration:
SYSTEM CONFIGURATION LIST
SYSTEM IDENTIFICATION
CONFIGURATION OF TEST HEAD
NUMBER OF TEST HEAD [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
TEST HEAD TYPE 1.650CH
2.1300CH [1,2] .....................> 2
PIN CONFIGURATION SLOT NO. [33,97,41,105]
CHILD A ....> 33,41,97,105
CHILD B ....> 33,41,97,105
CHILD C ....> 33,41,97,105
CHILD D ....> 33,41,97,105
CHILD E ....> 33,41,97,105
CHILD F ....> 33,41,97,105
CHILD G ....> 33,41,97,105
CHILD H ....> 33,41,97,105
PIN CONFIGURATION OPTION1 PIN CARD? [Y,N]
CHILD A ....> NO
CHILD B ....> NO
CHILD C ....> NO
CHILD D ....> NO
CHILD E ....> NO
CHILD F ....> NO
CHILD G ....> NO
CHILD H ....> NO
PIN CONFIGURATION OPTION2 PIN CARD? [Y,N]
CHILD AB ...> NO
CHILD CD ...> NO
CHILD EF ...> NO
CHILD GH ...> NO
CONFIGURATION OF TEST HEAD 2
TEST HEAD TYPE 1.650CH
2.1300CH [1,2] .....................> 2
PIN CONFIGURATION SLOT NO. [33,97,41,105]
CHILD A ....> 33,41,97,105
CHILD B ....> 33,41,97,105
CHILD C ....> 33,41,97,105
CHILD D ....> 33,41,97,105
CHILD E ....> 33,41,97,105
CHILD F ....> 33,41,97,105
CHILD G ....> 33,41,97,105
CHILD H ....> 33,41,97,105
PIN CONFIGURATION OPTION1 PIN CARD? [Y,N]
CHILD A ....> NO
CHILD B ....> NO
CHILD C ....> NO
CHILD D ....> NO
CHILD E ....> NO
CHILD F ....> NO
CHILD G ....> NO
CHILD H ....> NO
PIN CONFIGURATION OPTION2 PIN CARD [Y,N]
CHILD AB ...> No
CHILD CD ...> No
CHILD EF ...> No
CHILD GH ...> No
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
2'ND DPU : STN 1,2 [Y,N] ..........................> NO
TEST HEAD 1 DC CONFIGURATION [1-16] .............> 1-16
10V PPS CONFIGURATION [1-32] .............> 1-32
HV PPS CONFIGURATION [1-4] .............>
TEST HEAD 2 DC CONFIGURATION [1-16] .............> 1-16
10V PPS CONFIGURATION [1-32] .............> 1-32
HV PPS CONFIGURATION [1-4] .............>
1'ST GPIB I/F BOARD 0.NONE
1.BGR-010944X01
2.BGR-010944X02
3.BGR-010944X03
4.BGR-010944X04
5.BGK-012718 [0-5] .........> 0
2'ND GPIB I/F BOARD 0.NONE
1.BGR-016793 (DPU I/F)
2.BGR-010944X05
3.BGK-012718X02 [0-3] .........> 1
DMM TYPE 1.TR6861
2.R6871E
3.R6551 [1-3] .........> 3
AC FREQUENCY (HELTZ) [50,60] ........................> 50
CONFIGURATION OF TG
OPTION CLOCK : 48 EDGES [Y,N] .......................> NO
CONFIGURATION OF ALPG
SUB PG [Y,N] ....................................> NO
CONFIGURATION OF FM
NUMBER OF FM BOARD [0-8] ...........................> 0
PATTERN MEMORY [Y,N] ................................> NO
CONFIGURATION OF VRAM
VRAM3 OPTION [Y,N] ...........................> NO
CONFIGURATION OF FCDC
PIN CPE SEL [Y,N] ...........................> NO.
ADVANTEST T 5365是半导体测试行业领先者ADVANTEST Corporation的最终测试设备。该系统用于测试和验证集成电路的运行特性。该机组是一台高速、高计数的测试仪，最大测试速度为25 MHz，最小循环时间为100微秒。它能够同时测试多个设备，每小时测试高达160万针，并且可以手动、半自动或全自动操作模式操作。ADVANTEST T5365配备了两个可为各种测试应用定制的测试头。它有一个集成的脉冲发生器板，为测试提供高速、准确的定时信号。这台机器还配备了大型液晶显示器,便于监控测试和性能。该测试仪有一个集成数字连接工具，用于与外围设备和控制系统集成。该测试仪可配置为通过IEEE-488或以太网与外部系统通信,用于高速数据传输或远程控制应用。测试环境包括模块化准备测试板,允许对设备进行高性能测试。该资产还包含自动故障诊断功能,可以检测和报告快速和高密度应用程序中的错误。T 5365车型采用内置安全特性设计，非常适合在最苛刻的环境中使用。高性能电涌保护和ESD保护可以保护电源线和数据线,而输入和输出通道可以通过过度运行保护来保护。设备的硬件部件设计为承受冲击、振动和极端温度，使其适合生产线使用。总体而言，T5365种最终测试系统是为各行业集成电路的高精度测试和验证而设计的。它具有快速的测试速度、高密度的针脚计数、自动化的故障检测和诊断,以及广泛的安全功能,使其成为适合工业生产线测试的可靠、有能力的设备。
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