二手 ADVANTEST T 5592 #136077 待售

ADVANTEST T 5592
製造商
ADVANTEST
模型
T 5592
ID: 136077
Memory tester with M6751AD handler = /DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.144DR+192I/O 2.288DR+384I/O 3.576DR+768I/O? [1,2,3] ...........> 3 NUMBER OF TEST HEAD? [1,2] ...........................> 2 CONFIGURATION OF TEST HEAD 1 PE1 ( 1 - 6 , 19 , 33 - 38 ,51 , 52 ) CHILD A/B/C/D .....> YES PE2 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD A/B/C/D .....> YES PE3 ( 13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD A/B/C/D .....> YES PE4 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD A/B/C/D .....> YES PE5 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD A/B/C/D .....> YES PE6 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD A/B/C/D .....> YES PE7 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD A/B/C/D .....> YES PE8 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD A/B/C/D .....> YES PE9 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD A/B/C/D .....> YES PE10 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD A/B/C/D .....> YES PE11 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD A/B/C/D .....> YES PE12 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD A/B/C/D .....> YES PE13 ( 1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD E/F/G/H .....> YES PE14 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD E/F/G/H .....> YES PE15 ( 13 - 18 , 21 , 45 -50 , 55 , 56 ) CHILD E/F/G/H .....> YES PE16 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD E/F/G/H .....> YES PE17 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD E/F/G/H .....> YES PE18 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD E/F/G/H .....> YES PE19 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD E/F/G/H .....> YES PE20 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD E/F/G/H .....> YES PE21 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD E/F/G/H .....> YES PE22 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD E/F/G/H .....> YES PE23 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD E/F/G/H .....> YES PE24 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD E/F/G/H .....> YES CONFIGURATION OF TEST HEAD 2 PE1 ( 1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD A/B/C/D .....> YES PE2 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD A/B/C/D .....> YES PE3 ( 13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD A/B/C/D .....> YES PE4 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD A/B/C/D .....> YES PE5 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD A/B/C/D .....> YES PE6 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD A/B/C/D .....> YES PE7 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD A/B/C/D .....> YES PE8 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD A/B/C/D .....> YES PE9 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD A/B/C/D .....> YES PE10 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD A/B/C/D .....> YES PE11 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD A/B/C/D .....> YES PE12 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD A/B/C/D .....> YES PE13 ( 1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD E/F/G/H .....> YES PE14 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD E/F/G/H .....> YES PE15 ( 13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD E/F/G/H .....> YES PE16 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD E/F/G/H .....> YES PE17 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD E/F/G/H .....> YES PE18 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD E/F/G/H .....> YES PE19 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD E/F/G/H .....> YES PE20 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD E/F/G/H .....> YES PE21 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD E/F/G/H .....> YES PE22 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD E/F/G/H .....> YES PE23 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD E/F/G/H .....> YES PE24 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD E/F/G/H .....> YES CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32 10V PPS CONFIGURATION [1-128] ......> 1-128 TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32 10V PPS CONFIGURATION [1-128] ......> 1-128 AC FREQUENCY (Hz) [50,60] ........................> 60 CONFIGURATION OF ALPG NUMBER OF ALPG [1,2,4] ..............................> 4 ONFIGURATION OF PDS NUMBER OF CYCLE PALETTE? [8,16] ......................> 8 CONFIGURATION OF DBM DBM OPTION EXIST? [Y,N] ..............................> YES SIZE OF DBM BOARD? [1-2] [1:256K? 2:1M] ..............> 2 CONFIGURATION OF FM NUMBER OF FM BOARD? [0,4,8] ..........................> 0 END SAVE = /LOG OFF ADVANsite Software Product Information? 08-APR-2009 08:52:21 System Software : ASX/U-51 Version : 6.00A1 CPU Type : SPARC Product P number Revision [Expected] Date Label Title -------------------------------------------------------------------------------- ASXUBASE PASX51-92**** 2.03 [ ] 01-DEC-1989 ROOT SunOS Release 5.7 ATW51SU PASX51-92**** 6.00A [ ] 28-JAN-2002 ATLW51 ATLworks for T5500 Series DIAG5592SU PASX51-92**** 1.05B [ ] 15-MAY-2002 DG5592 Tester Diagnosis (T5592) ICD51SU PICD51-00**** 1.03 [ ] 02-NOV-2000 ICD51 ICD/U-51 One Line Compiler MPEDIT51SU PMPE51-00**** 1.02 [ ] 02-NOV-2000 MPE51 MPEDIT/U-51 Memory Pattern Editor SYSTEST51SU PASX51-92**** 6.00A1 [ ] 06-MAR-2002 SYST51 ADI/SYS TEST (T5581 Series) TESTUTL51SU PASX51-92**** 6.00A1 [ ] 06-MAR-2002 TUTL51 Tester Utilities (T5581 Series) WBMA51SU PWBM51-00**** 4.01 [ ] 31-JAN-2001 WBMA51 Workbench-M2 for T5500 Series (Analysis Tools) WBMW51SU PWTR51-00**** 4.01 [ ] 08-FEB-2001 WBMW51 Workbench-M2 for T5500 Series (WaveTracer2) XATL51SU PXTL51-00**** 5.04A [ ] 08-MAR-2001 XATL51 XATL/U-51 Cross Compiler.
ADVANTEST T 5592是一种最终测试设备,其设计目的是在各种设备上快速高效地执行各种测试。它支持对各种组件和功能(包括数字逻辑电路和模拟设备)进行精确和自动化的测试。该系统采用高速双阶段测试技术,旨在为需要质量导向性能的产品提供快速、准确的测试。T 5592的核心是其先进的测试技术。该单元采用双阶段测试,以确保更准确的结果。在测试过程的第一阶段,机器能够检测和分析设备,从而实现详细的分析和事件响应。第二阶段测试涉及一个能够快速检测、分析和比较设备的并行架构;这会导致快速的测试和更快的校正。此外,该工具还能够访问庞大的组成部分信息数据库,从而能够进行进一步的分析和比较。此外,ADVANTEST T 5592还提供了增强的GPRS测试功能,并具有全面的远程访问和日志记录功能。其GPRS测试功能允许用户通过多个阶段的测试快速准确地测试各种GPRS产品。该资产还通过实时图形和图表对结果数据进行全面的可视化,从而全面衡量设备性能。在使用方面,T 5592的双级测试方便了组件和型号级别的测试,允许性能优化和质量控制。该设备能够实时访问和分析设备信息,这使其成为产品开发的理想解决方桉,为设备设计和性能提供了宝贵的见解。此外,该系统还可用于电路和功能测试,以确保设备的可靠运行和质量。总体而言,ADVANTEST T 5592是一个高级测试单元,其特性和功能可对多种产品进行精确高效的测试。其双阶段测试、GPRS测试能力和实时数据分析使其成为产品开发和电路测试的理想选择。这台机器的性能优化和质量控制功能确保了各种组件和设备的可靠和准确的结果。
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