二手 METRICON 2010 #9246090 待售

Prism coupler Reflective index: Single / Dual thin film layers Measurement accuracy and resolution: Index accuracy: ± .001 Thickness accuracy: ± (0.5% + 50 A) Index resolution: ± .0005 Thickness resolution: ±0.3% Refractive index measuring range: Films and bulk materials with refractive index: 2.45 Films with index up to 2.70 (Depending on film thickness) Typical measurement time: 10-25 Seconds with standard table 15-75 Seconds with high resolution table Index measurement of bulk materials / thick films: Accuracy: ± .001 Resolution: ± .0005 Bulk measurement: 5-20 Seconds Operating wavelength: Low power: 0.5mW He-Ne Laser: 632.8nm CDRH / BRH Class II Substrate materials: Silicon GaAs Glass Quartz Sapphire GGG Lithium niobate Substrate size: Up to 150 mm² Prism types / Index range: 200-P-1 / <1.80 200-P-2 / 1.70-2.45 200-P-3 / <2.10 200-P-4 / <2.02 Rotary table step size: 3.0 or 1.5 min High resolution tables: 0.9/0.45 or 0.6/0.3 min No-charge option.