二手 DVT SOLUTION Gigaprobe DVT30-1MM #102353 待售
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ID: 102353
Hand held probe for TEKTRONIX TDR oscilloscopes
30GHz, Differential & Single-end, 0.25~2mm pitch adjustable
Used for: TDR/TDT, S-parameter
Features:
30 GHz Bandwidth
True Odd Mode 100 ohm Differential Input Impedance
Probe can be converted to 50 ohm input impedance
TDR Launch Discontinuity <20 mv
Fall Time 20 ps or <5 ps Fall Time Degradation
Fully Balanced Differential Signals without Ground Contact
Adjustable Probe Pitch from 0.25 mm to 2.0 mm
Probe Tip diameter 0.254 mm
Gold Plated Conductive Diamond non oxidizing probe tips for
repeatable TDR measurements
Low probing force <10 grams
Four probes in one: Use as a 100 ohm, 50 ohm, as a Hand Probe or
Mount in a probe articulating arm for hands free probing
Full Set of Probe Pitch Calibration Accessories Included
Characteristics:
Attenuation: 1X
Probe Only Bandwidth: 30 GHz
TDR Degradation: <5 ps
Probe Pitch: 0.25 mm to 2.0 mm (signal tip to signal tip)
Connector Type: SMA
Measured Reflected TDR Fall Time: 20 ps
Impedance: 100 differential, 50 common mode,
Max Voltage In: 5.0 V
(Note: numeric values shown are typical)
Applications:
Create - Single Ended, Differential Insertion, Return Loss Sparameters
from TDR/ TDT Measurements for determining interconnect
bandwidth performance using Tektronix DSA8200 TDR and IConnect®
Impedance Testing - Use IConnect for precision impedance analysis
of IC Packages, Cables, PCB’s and Backplane Testing
Failure Analysis of Device Packages - Locate failure modes.
DVT SOLUTION Gigaprobe DVT30-1MM是一种先进的半导体探测装置,设计用于在测试和测量半导体材料性能时提供业界领先的精度和速度。该单元包含一系列高精度探针,具有超低噪声设计,使用户能够精确测量来自最小电路的电信号。该设备采用紧凑、符合人体工程学的设计,具有长而稳定的平台,可进行高效测试。可调节的主轴支架允许轻松定位,以快速访问和精确定位测试元件,从而实现更快的探测和更好的性能。该平台还允许快速对准和前部进入设备,这有助于减少来自外部污染物的污染。探头设计用于提供强大而安静的操作,在数据采集过程中最大程度地减少热量和噪音。该探头具有独立的接地回波特性,用于简化屏蔽信号探测,并具有内部加热功能,可确保与精确读数的高度一致性。可移动的样品处理臂提供快速的样品装卸,创造了一个高效的测试解决方桉。Gigaprobe DVT30-1MM还提供四个用户可选择的接触力级别的自动联系人识别和动态自动参考检查,确保每个联系人都经过正确测试。此外,通过基于反馈的电压极限设置和使用多电压探头的自动非接触式测试,可以最大限度地延长测量周期时间。总体而言,DVT SOLUTION Gigaprobe DVT30-1MM是一款创新、高效且功能强大的处理器,旨在满足最棘手的半导体测试需求。其先进的特性、可靠的性能和高速的数据采集使其成为寻求可靠和准确的探测解决方桉的实验室和半导体测试专业人员的理想选择。
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