二手 SPEA 4060 S2 #9282914 待售

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製造商
SPEA
模型
4060 S2
ID: 9282914
Flying probe tester With bottom side moving head Working hours: 100 P/N / Description 4060s2M BU500 / 4060s2 Manual loading base unit, (4) top moving heads LCK 230 / Board locking mechanism, automatic lock (12 clamps), automatic width adjustment set YAICT 320FP / Motor for BSMH, for 4060s2 M L2FLY R120 / ICT Instruments unit, dual 4 quadrants DC source ±10V/±100mA, ±50V/±100mA, DVM L2BP R120 / Leonardo OS2 FLY Execution AS 6 / Leonardo OS2 Backplane JCS 10 / Test area extension to 686 x 600 mm (27x23"), top side, BSMH compatible with system setup OPS 450 / Open pin test, junction scan OPS 550 / Open pin test - Electroscan on axis 1 & 4 top OPS 560 / Open pin test - Electroscan on axis 5 bottom side moving head ESV 100 / Open pin test - Electroscan on axis 6 bottom side moving head PRT 60 / Electrical & pneumatic energy saving function DK 115 / Internal graphic printer, 24 lines/sec, USB HLD 11 / Base diagnostic tool for FP s2 PRD USA S2 / Stand for monitor, keyboard and printer MSD 120 / Standard system pre-configuration, for 4060s2 SPS 15 / Motorized sliding door, for 4060 M/SL AUS 10 / System power supply, three phase, 208V, for FPs2 CTI 310 / Auxiliary AC sockets, qty 3, 220V, CE BSMH 261 / Connector tester interface, up to 576 TP, for 4060s2 PKB 400 / Bottom side moving heads, 2 heads, optical alignment module with color camera, for LCK 200 series YASCA 64EC / 2x Linear Z axes for bottom side moving heads, for 4060s2 STO 100 / Analog matrix, 64ch, 4/8rows, 120V, 1A, extendable with digital channels, external connection, test interface, for FPS2 LEO2 GOLD FLY / Resistance short test SSD 20 / Leonardo OS2 Suite Fly - Gold - R1.10 1SM 100 / SPEA dongle for LAN installation OPT 400 / Call center support LTM 100 / Automatic optical inspection, alignment, rotation, presence, optical character verify LTA 100 / Laser test module, Accuracy 0.01mm, Spot Ø 0.07mm.
SPEA 4060 S2是一种自动化的半导体晶圆处理装置。它旨在满足集成电路测试和燃烧操作的需要,重点是具有中高密度触点或精细特征分辨率的IC。4060 S2具有双轴设计,其晶圆处理臂沿着螺旋桨的长轴移动,接触臂沿横向轴移动。这种双轴系统允许精确定位接触臂,以确保精确探测。Prober还配备了模式识别能力,允许晶片与接触臂有效对准。此高级功能允许在不同晶圆大小和形状之间轻松切换。此外,SPEA 4060 S2还具有集成的通过/故障报告功能,可提高生产线测试的效率。Prober还配备了高级安全功能,以确保过程安全准确地执行,而不会损害整个过程。Prober配备了触摸安全开关,这意味着用户可以暂停晶圆运动,以减少接触错误或其他与操作员相关的故障的机会。此外,4060 S2还具有机电安全门,当感应到潜在的接触时,它会激活。在性能方面,SPEA 4060 S2可以以每个接触点最高5毫秒的速度执行探测操作。Prober的设计还允许最大4.0mm的峰峰校准精度,使其在测量各个接触点时具有极好的精度。4060 S2的附加特性包括广泛的力控制参数,允许使用者调整用来与晶圆接触的力,以尽量减少对集成电路或晶圆的伤害。总体而言,SPEA 4060 S2是一种用途广泛、精密的半导体晶圆处理装置,非常适合中高密度接触测试。凭借其先进的模式识别、通过/失败报告功能、安全功能和高性能功能,它是测试和刻录操作的绝佳选择。
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