二手 AMAT / APPLIED MATERIALS Endura II Aluminum Interconnect #9392312 待售

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ID: 9392312
Physical Vapor Deposition (PVD) System, 12" Process: Reflowsput Chamber Position C- Process type reactive PC Process type SIP Ti: 1 And 5 Process type ALPS: 2 HT Al: 3 And 4 D - RT DSTTN Process Type: Reactive PC Chamber position: C Chamber body: Al Part number: 0040-76718 Slit valve Seal: Bonded Door part number: 0040-84391 Bias Generator Frequency: 13.56 MHz and 2 MHz(In one generator) RF: Coil generator: COMDEL CDX-2000 Match box: 0010-21748 / 0010-52033 AMAT / APPLIED MATERIALS Part number : 0190-23308 Adaptor part/number: 0041-02659 Upper shield part/number: BELLJAR 0040-55456 Treatment (Arc spray / bead blast): AL2O3 Lower shield part/number: 0040-86514 Treatment (Arc spray / bead blast): Bead Blast inner / mid shield part/number: 0021-19342 Shield clamp part/number: 0020-19258 Inner / mid shield clamp part/number: Insulator 0200-01903 Cryo gate valve (2/3 Pos): PENDULUM MFC 1 Gas: He Cal Factor: 1 Size: 300 Type: He Part number: 0010-44160 MFC 2 Gas: Ar2 Cal Factor: 1 Size: 200 Type: Ar Part number: 3030-13113 MFC 3 Gas: A Cal Factor: 1 Size: 20 Type: Ar Part number: 3030-13116 MFC 4 Gas: (MFC6) H2 Cal Factor: (MFC6) 1 Size: (MFC6) 100 Type: (MFC6) H2 Part number: (MFC6) 0015-02990 Chamber base pressure (T): 0.0000002 Chamber Rate of rise (nTorr / min): 15000 Process Ar supply pressure: 34.7 Process N2 supply pressure: 33.9 Vent Ar pressure: 47.7 Optional Gas (He): 30.1 CDA: 95.7 Slit valve CDA: 85 Cooling water flow (GPM): 0.8 Process type: SIP Ti Chamber position: 1,5 Shutter option chamber body: (Al or SST): SS Part number: 0040-98657 Slit valve: Seal: Bonded Valve door part number: 0040-84391 Target: Vendor: Nikko/Tosoh Bakeout / idle power (%): 0.4 DC Power supply (AE-MDX): AE-Pinnacle AMAT Part number Master: 0190-08122 AMAT Part number Slave: 0190-08122 Generator size : 20kw DC (12 kwh, 24kwh): 40 kw Bias generator : ENI - GHW12Z AMAT Part number : 0190-25529 Bias Generator: Size: 1.25KW Frequency: 13.56 MHz Rf Match Box: 0010-02372/0010-52034 Magnet: Rotation speed (RPM): 65 Shim thickness: Ch1:1.25mm Ch5:1.0mm Type: LP-3.7.4 Part number: 0010-11228 Target to magnet spacing (mm): 1.5 ± 0.6 Adaptor part number: 0040-82921 Kit spacer: Upper part number: 0040-7694 Lower part number: 0040-62877 Upper shield part number: 0020-23549 Treatment: (Arc spray/Bead Blast): Arc Spray (Arc spray/Bead Blast): Bead Blast Lower shield: Part number: 0020-02344 Clamp part number: 0020-02348 Inner / mid shield: Part number: 0020-54777 Clamp part number: 0020-08299 Dep ring part number: 0200-08301 Cover ring part number: 0021-17770 Insulator bushing part number: 0200-00590 Shutter: 0021-25014 Pedestal: Type: SLT FDR E-CHUCK Part number: 0010-22985 Heater spacing in steps: -55050 Maximum Cryo regen gas load (L): 400 Cryo gate valve (2/3 Pos): 3-Position MFC 1: Gas: N2 Size: 200 Type: N2 MFC 3: Gas: Ar Size: 50 Type: Ar MFC 4: Gas: ArH Size: 20 Chamber base pressure (T): 2.0 e-8 Chamber Rate-of-Rise (nTorr / min): 522 Process supply pressure: Ar 30psi N2 30psi Cryo regen N2 pressure: 90 Vent Ar pressure: 40 CDA: 88 Slit valve CDA: 82 Cooling water flow (GPM): 8.9 Vent Ar pressure: 47.7 Lower shield part number: 0021-22065 Upper shield part number: 0021-21234 Process type: (RT DSTTN) Chamber position: D Heater spacing: 55mm Steps: -51000 Optional gas (He): 37.9 CDA: 95.7 Cooling water flow (GPM): 11.2.
AMAT/APPLIED MATERIALS Endura II铝互连(AMAT)集成了专门为生产铝基互连而设计的独特设计。该反应堆用于先进半导体和光电器件的开发。它是有机场效应晶体管(OFET)和有机发光二极管(OLED)等技术的理想设备。AMAT Endura II铝互连具有各向异性蚀刻工艺,可确保精确的互连。这是由于电感耦合等离子体源和低压等离子体源的结合操作而实现的,这两个源允许蚀刻具有垂直边缘、低接触电阻和金属无过多损失的高长宽比金属痕迹。ICP源与一个电阻、低压、过滤过的Ar-Cl2(氙-氯)工艺室结合,具有集成的、计算机控制的动态温度控制系统。这种组合提供了精密的链路处理,能够产生高长宽比的特性,而不会有任何过度的金属损失。它还配备了动态压力控制(DPC)单元,可确保工艺条件得到优化,以实现更好的工艺控制,并提高互连设计的可重复性。这台机器还具有现代化的图形用户界面,可以用来控制过程参数。它还可以导入和导出GDSII文件,允许将现有设计转换为APPLIED MATERIALS互连格式。有了通过直观的命令支持角层覆盖和控制的能力,可以产生各种各样的工艺晶片。APPLIED MATERIALS Endura II Aluminum Interconnect还具有滤过式技术,该技术能够实现低温互连,并提高平面性和较低的固有接触电阻。这项功能由自动低温聚合物喷射工具支持,用于通过互连过滤。最后,Endura II铝互连(AMAT/APPLIED MATERIALS)为生产先进的铝基互连提供了集成、精确、高生产率和低成本的解决方桉。这一资产能够产生垂直边缘、接触电阻低、金属不会过度损失的高长宽比金属迹线,使其成为下一代光电和半导体技术的理想选择。
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