二手 HITACHI S-3500N #9046383 待售
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ID: 9046383
SEM
Resolution: 3.0nm at 25kV, secondary electron image
20nm at 3kV, secondary electron image
4.5nm at 25kV, backscattered electron image
Magnification: x15 - x300,000 (65 steps)
Accelerating voltage: 0.3 - 30kV
Variable pressure range: 1 - 270Pa
High and low vacuum operation
Backscatter electron detector
Energy Dispersive X-ray (EDS)
Orientation Imaging Microscopy (OIM)
Tungsten filaments
Optics:
Filament – pre-centered tungsten hairpin
Gun bias – self bias and continuously variable bias
Accelerating voltage: 10-30 kV
Emission current: 10-12 to 10-7
Gun alignment: 2-stage electromagnetic alignment
Condensers lens: 2-stage electromagnetic condenser
Objective lens: super conical lens
Objective lens aperture: 4 opening moveable aperture
Stigmator coil: 8-pole electromagnetic X/Y correction for astigmatism
Image shift: +/- 20 microns or more (for working distance 15 mm)
Specimen stage: Large-size eucentric stage
Movement range: 80mm x 40 mm
Tilt angle: 0° to +60°
Rotation angle: 360°
Image Display: Secondary electron
Scanning modes: TV scan, slow scan (4 steps), selected area scan, waveform, photo scan (4 steps), split screen and dual screen
Data display: accelerating voltage, magnification, micron scale, micron value, film number, working distance, value, time/date, photo magnification, detector
Data entry; input through full key board (alphabetic characters numerics and symbols)
Graphic input: straight lines, circles arrows etc.
Image memory:
Display (640 x480)
High resolution (1280 x 960)
Ultra-high resolution (2560 x 1920)
Computer system:
Hitachi soft-ware on Compaq PC with Windows 95, Pentium 160 MB processor
Hitachi software
Quartz PCI – imaging program
Auxiliary computer for EDS system – Dell, Intel Pentium
Two direct drive vacuum rotary vacuum pumps – Hitachi brand
Type VR16LPP 50 Hz, 60 Hz
Displacement 140, 160l/min
Ultimate pressure – 10-2 Pa
6W Infared Chamberscope
Components:
EDS system: PGT OPH045-1038
Backscattered detector
BSD system: Robinson
Computer system uses zip drives for downloading data, not USB
Original manuals and two Wehnelt cylinders.
HITACHI S-3500N扫描电子显微镜（SEM）是一种功能强大的仪器,为分析各种材料提供高精度和分辨率。它能够产生有机和无机样品的详细图像，放大倍数可达10万倍。显微镜设计有自动化导航系统和低能环境室，可以对甚至复杂的样品进行高分辨率的简化和分析。利用电子光学器件和内置的能量色散X射线探测器，S-3500N提供了无与伦比的精度和速度在明暗场扫描。其扫描透射电子显微镜（STEM）功能可以方便地检测光元素和结构特征。此外，显微镜可以获得高对比度、低噪声的图像，即使是最复杂的纳米结构。HITACHI S-3500N模型还能够在负染色、高真空、脱水和特殊气体大气中执行成像和分析任务。它采用特殊的气体入口特性，可以控制样品中各种气体的引入。此功能结合探测器设计,可生成外延层、绝缘体和半导体中微量元素或局部掺杂物的分析信息。S-3500N是一种用户友好的仪器，具有直观的图形用户界面。其嵌入式应用套件包括实时过程监控、图像测量、单粒子分析、光谱成像、egun选择器等组件。此外,用户还可以通过范围的USB接口连接到一系列外部设备,从而可以同时从多个来源获取图像和数据。总体而言，HITACHI S-3500N扫描电子显微镜是生物医学研究、半导体工程、微加工和显微镜等应用的理想选择。其强大的成像和分析能力使其成为寻找高质量、准确数据和结果的人的理想工具。
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