二手 HITACHI S-4500 #9169489 待售
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ID: 9169489
Scanning electron microscope (SEM)
Specifications:
Photo CRT:
Ultra high resolution type
Recording area: 120 x 90 mm
Scanning mode:
Normal scan
Split screen / Dual magnification
Line scan
Position setting
Spot
AAF (Analysis area finder)
SAA (Selected area analysis)
Oblique mode
Scanning speed:
0.3, 2, 10, 20 S / Frame for viewing mode
TV, 40,80, 160 S / Frame for photo recording mode
Signal processing / Operation mode:
Automatic brightness & contrast control
Gamma control
Dynamic stigmator monitor
Auto focus
Automatic stigmator
Electrical image shift: ± 20 µm With WD 20 mm
Vacuum system:
Vacuum sequence: Full-auto pneumatic valve system
Ultimate vacuum:
7 x 10-4 Pa (Specimen chamber)
1 x 10-7 Pa (Electron gun chamber)
Vacuum pumps:
Electron optics: (3) Ion pumps
Specimen chamber:
(1) Diffusion pump
(2) Rotary pumps
Compressor
Ion pumps:
IP1= 0.1 x 10-7
IP2= 0.5 x 10-7
IP3= 6 x 10-7
Accessories:
THERMO-SCIENTIFIC EDS Tank
EDS Computer / Controller: No
GW Microchannel:
Control
Detector: No
GW Infrared: Camera control and camera on system
Control panel on SEM
Small manual stage
Performance:
Resolution: 1.5 nm
Accelerating voltage: 30 kV
Working distance: 7 mm
Magnification:
High magnification mode: 50x to 500,000x
Low magnification mode: 20x to 1,000x
Electron optics:
Electron gun: Cold-cathode field emission electron gun
Emission extracting voltage (Vext): 0 to 6.5 kV
Accelerating voltage (Vacc): 0.5 to 30 kV (Variable in 100 V step)
Lens system: 3-Stage electromagnetic lens
Objective aperture:
Movable aperture ((4) Opening selectable / Alignable outside column)
Self-cleaning type thin aperture
Stigmator: Electromagnetic type
Scanning coil: 2-Stage electromagnetic type
Display unit:
CRT: (2) 12" Display monitors including memory unit.
HITACHI S-4500是一种扫描电子显微镜（SEM），专门设计用于成像范围广泛的样品表面，从大型标本到小型微观结构。HITACHI S 4500的最大放大倍率为270,000倍,超高分辨率为0.7 nm,能够揭示单个样品中包含的大量细节。S-4500利用由两个半球气泡透镜和一个投影透镜组成的半无色物镜，将高能电子束聚焦到一个精细点。光束以光栅模式在样品上扫描，从样品表面反射的电子在电子探测器中收集。然后将这些电子转换为数字图像，用于构造样品表面的3D表示。S 4500还具有自动化的综合测量和成像功能,可以直接从生成的图像中进行测量。这允许对样品进行定量分析，包括物理测量和电气特性。这些测量对于广泛的行业和研究应用至关重要。HITACHI S-4500有一个真空环境室，允许它与需要在真空条件下检验的样品一起使用。这对于生物组织和半导体器件等样品的检验尤为重要。SEM还包含一个自动化的样品交换系统，使样品能够在不打破真空的情况下快速高效地进行更换。HITACHI S 4500产生高度详细的图像,使科学家和工程师能够以复杂的细节研究任何给定样品的表面。这反过来又使他们能够分析和识别缺陷，分析材料组成，更深入地了解各种组件和产品的微观结构。因此，HITACHI的S-4500是许多行业的宝贵工具，从汽车工程和微电子学到材料科学和生物成像。
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