二手 HITACHI S-4700 #9058859 待售
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已售出
ID: 9058859
优质的: 1998
Field emission scanning electron microscope (FE SEM)
Type I
Resolution:
Accelerating voltage: 15 kV
Working distance: 12 mm 1.5 nm
Accelerating voltage: 1 kV
Working distance: 2.5 mm 2.5 nm
Magnification:
High magnification mode: 100x to 500,000x
Low magnification mode: 20x to 2,000x
Electron optics:
Electron gun: Cold cathode field emission
Extracting voltage (Vext): 0 to 6.5kV
Accelerating voltage (Vacc): 0.5 to 30kV (in 100V steps)
Lens: 3-stage electromagnetic lens, reduction type
Objective lens aperture: Moveable aperture
(4) Openings selectable / Align-able outside column
Self-cleaning thin aperture
Astigmatism correction coil (Stigmator): Electromagnetic type
Scanning coil: 2-stage electromagnetic-deflection type
Specimen stage:
X Traverse o to 25 mm (Continuous)
Y Traverse o to 25 mm (Continuous)
Z Traverse 2.5 to 27.5 mm (Continuous)
Tilt -50 to +450
Rotation: 3600 (Continuous)
Specimen size (Airlock type specimen exchange)
Maximum: 100 mm (Diameter)
Display unit:
Display type: Flicker- free image on PC monitor (Full scanning speeds)
Viewing monitor: Type 17
Color: 1024 x 768 pixels
Photo CRT (Option): Ultra-high resolution type (Effective field of view 120 x 90 mm)
Scanning modes: Normal
Reduced area
Photo
Split/Dual magnification
Line
Position setting
Spot
AAF (Analysis Area Finder)
SAA (Selected Area Analysis)
Scanning speeds: Fast
Slow: 0.5 to 40 see for frame viewing
For photo mode: 20/17, 40/33, 80/67, 160/167, 320/333
Fast: NTSC or PAL signal Value of (50 HZ)/(60 Hz)
Signal processing modes:
Automatic brightness control
Gamma control
Automatic focus
Automatic stigmator
Automatic data display:
Film number
Accelerating voltage
Magnification
Micron bar
Micron value
Date / Time and working distance
Data entry:
Alphanumeric characters
Numbers and marks can be written on image from keyboard
Electrical image shift: +/- 15um (WD = 12mm)
Evacuation system:
System type: Fully automatic pneumatic-valve
Ultimate vacuum levels: Specimen chamber 7 x 10'4 Pa
Electron gun chamber:
IP-1 2 x 10'7 Pa
IP-2 2 x 10'6 Pa
IP-3 7 x 10'5 Pa
Vacuum pumps: Electron optical system: (3) Ion pumps
Specimen chamber: Oil diffusion pump
Turbo molecular pump (option)
(2) Oil rotary pumps
Oil-less type compressor
Protection devices:
Warning devices power failure
Cooling-water interruption
Inadequate vacuum
Others:
Acoustic noise Less than 65 dB
Dielectric voltage-withstand: 1500VAC/1min
No EDX
1998 vintage.
HITACHI S-4700是为一系列高性能应用而设计的高级扫描电子显微镜(SEM)。显微镜结合了高分辨率和放大成像以及广泛的标本观测模式。HITACHI S 4700具有重新设计的控制系统,称为SmartMeister,优化了操作和数据采集体验。SmartMeister的用户友好界面旨在使复杂的数据分析过程更易于理解,并允许用户对成像条件进行快速调整。仪器配有可变真空室,确保在保持高图像分辨率的同时精确观察样品。可变真空室还有助于通过防止空气进入腔室来显着减少污染。S-4700实现高分辨率成像,纳米级分辨率和放大倍数可达300,000倍。该仪器还包含了广泛的控制和分析功能,包括可以定制以满足各种要求的高级分析软件。显微镜包括二次电子成像(SEI)、反向散射电子成像(BEI)、能量色散光谱(EDS)和电子反向散射衍射(EBSD)等观测模式。这些模式允许对广泛的材料特性进行详细分析,包括组成人口统计学、地形学以及对局部电场的评价。S 4700能够生成对象的3D图像,并配备了自动化操作功能,从而实现了节省时间和一致的操作。该仪器还包括一个大型样板阶段、一个自动化的样板变更机制、一个全自动的查看系统,以及对实施自动化工作流程的支持。总体而言,HITACHI S-4700是一种高级扫描电子显微镜,专为一系列高性能应用而设计。该仪器包含各种控制和分析功能,能够对材料特性和自动化能力进行详细分析,以实现高效操作。
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