二手 HITACHI S-4700 #9058859 待售

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HITACHI S-4700
已售出
ID: 9058859
优质的: 1998
Field emission scanning electron microscope (FE SEM) Type I Resolution: Accelerating voltage: 15 kV Working distance: 12 mm 1.5 nm Accelerating voltage: 1 kV Working distance: 2.5 mm 2.5 nm Magnification: High magnification mode: 100x to 500,000x Low magnification mode: 20x to 2,000x Electron optics: Electron gun: Cold cathode field emission Extracting voltage (Vext): 0 to 6.5kV Accelerating voltage (Vacc): 0.5 to 30kV (in 100V steps) Lens: 3-stage electromagnetic lens, reduction type Objective lens aperture: Moveable aperture (4) Openings selectable / Align-able outside column Self-cleaning thin aperture Astigmatism correction coil (Stigmator): Electromagnetic type Scanning coil: 2-stage electromagnetic-deflection type Specimen stage: X Traverse o to 25 mm (Continuous) Y Traverse o to 25 mm (Continuous) Z Traverse 2.5 to 27.5 mm (Continuous) Tilt -50 to +450 Rotation: 3600 (Continuous) Specimen size (Airlock type specimen exchange) Maximum: 100 mm (Diameter) Display unit: Display type: Flicker- free image on PC monitor (Full scanning speeds) Viewing monitor: Type 17 Color: 1024 x 768 pixels Photo CRT (Option): Ultra-high resolution type (Effective field of view 120 x 90 mm) Scanning modes: Normal Reduced area Photo Split/Dual magnification Line Position setting Spot AAF (Analysis Area Finder) SAA (Selected Area Analysis) Scanning speeds: Fast Slow: 0.5 to 40 see for frame viewing For photo mode: 20/17, 40/33, 80/67, 160/167, 320/333 Fast: NTSC or PAL signal Value of (50 HZ)/(60 Hz) Signal processing modes: Automatic brightness control Gamma control Automatic focus Automatic stigmator Automatic data display: Film number Accelerating voltage Magnification Micron bar Micron value Date / Time and working distance Data entry: Alphanumeric characters Numbers and marks can be written on image from keyboard Electrical image shift: +/- 15um (WD = 12mm) Evacuation system: System type: Fully automatic pneumatic-valve Ultimate vacuum levels: Specimen chamber 7 x 10'4 Pa Electron gun chamber: IP-1 2 x 10'7 Pa IP-2 2 x 10'6 Pa IP-3 7 x 10'5 Pa Vacuum pumps: Electron optical system: (3) Ion pumps Specimen chamber: Oil diffusion pump Turbo molecular pump (option) (2) Oil rotary pumps Oil-less type compressor Protection devices: Warning devices power failure Cooling-water interruption Inadequate vacuum Others: Acoustic noise Less than 65 dB Dielectric voltage-withstand: 1500VAC/1min No EDX 1998 vintage.
HITACHI S-4700是为一系列高性能应用而设计的高级扫描电子显微镜(SEM)。显微镜结合了高分辨率和放大成像以及广泛的标本观测模式。HITACHI S 4700具有重新设计的控制系统,称为SmartMeister,优化了操作和数据采集体验。SmartMeister的用户友好界面旨在使复杂的数据分析过程更易于理解,并允许用户对成像条件进行快速调整。仪器配有可变真空室,确保在保持高图像分辨率的同时精确观察样品。可变真空室还有助于通过防止空气进入腔室来显着减少污染。S-4700实现高分辨率成像,纳米级分辨率和放大倍数可达300,000倍。该仪器还包含了广泛的控制和分析功能,包括可以定制以满足各种要求的高级分析软件。显微镜包括二次电子成像(SEI)、反向散射电子成像(BEI)、能量色散光谱(EDS)和电子反向散射衍射(EBSD)等观测模式。这些模式允许对广泛的材料特性进行详细分析,包括组成人口统计学、地形学以及对局部电场的评价。S 4700能够生成对象的3D图像,并配备了自动化操作功能,从而实现了节省时间和一致的操作。该仪器还包括一个大型样板阶段、一个自动化的样板变更机制、一个全自动的查看系统,以及对实施自动化工作流程的支持。总体而言,HITACHI S-4700是一种高级扫描电子显微镜,专为一系列高性能应用而设计。该仪器包含各种控制和分析功能,能够对材料特性和自动化能力进行详细分析,以实现高效操作。
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