二手 HITACHI S-4800 #9209753 待售
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ID: 9209753
优质的: 2008
Field Emission Scanning Electron Microscope (FE-SEM)
With HORIBA EDX system
Workstation: HP DC7100MT
Declaration mode: 2.0 nm at 1 kV, WD: 1.5 mm, Normal mode
Stigmator: Octopole electromagnetic
EYELA Cool Ace CA-1111 Chiller
UPS
HITACHI Air compressor
Operating system: Windows XP
Resolution:
Accelerating voltage: 15 kV
Working distance: 4 mm to 1.0 nm (220,000x)
Accelerating voltage: 1 kV
Working distance: 1.5 mm to 2.0 nm (120,000x)
Magnification:
High magnification mode: 100x to 800,000x
Low magnification mode: 20x to 2,000x
Electron optics:
Electron gun: Cold cathode field emission type
Extracting voltage (Vext): 0 to 6.5 kV
Accelerating voltage (Vacc): 0.5 to 30 kV (in 100 V steps)
Lens: 3-Stage electromagnetic lens, reduction type
Objective lens aperture:
Movable aperture (4 Openings selectable / Alignable outside column)
Self-cleaning thin aperture
Astigmatism correction coil: Electromagnetic type (Stigmator)
Scanning coil: 2-Stage electromagnetic electron optics
Specimen stage:
X-Traverse: 0 to 50 mm (Continuous)
Y-Traverse: 0 to 50 mm (Continuous)
Z-Traverse: 1.5 to 30.0 mm (Continuous)
Tilt: -5° to +70°
Rotation: 360° (Continuous)
Specimen size: Max 100 mm (Diameter)
(Airlock type specimen exchange)
Display unit:
Display type: Flicker-free image on PC monitor (Full scanning speeds)
Viewing monitor: Type 18.1 LCD
Option: Type 21 Color CRT (1280 x 1024 pixels)
Photo CRT (Option): Ultra-high resolution type
(Effective field of view 120 x 90 mm)
Full screen: 1280 x 960 Pixels
Reduced area:
640 x 480 Pixels
320 x 240 Pixels
Dual Image: 640 x 480 Pixels
Scanning modes:
Normal scan
Reduced area scan
Line scan
Spot analysis
Average concentration analysis
Split / Dual magnification
Scanning speeds:
TV (640 x 480 pixel display: 25 / 30 frames/s)
Fast (Full screen display: 6.25 / 7.5 frames/s)
Slow:
(Full screen display: 1 / 0.9 , 4 / 3.3 , 20 / 16, 40 / 32 ,80 / 64 Frames/s)
(640 x 480 pixels display: 0.5 / 0.4 , 2 / 1.7 , 10 / 8 , 20 / 16, 40 / 32 Frames/s)
Photograph: 2560 x 1920 Pixels
Display: 40 / 32, 80 / 64, 160 / 128, 320 / 256 Frames/s
Value: 50 Hz / 60 Hz
TV: NTSC or PAL Signal
Signal processing modes:
Automatic brightness control
Gamma control
Automatic focus
Automatic stigmator
Automatic data display:
Image number
Accelerating voltage
Magnification
Micron bar
Micron value
Data / Time
Data entry: Alphanumeric characters, number, and marks
Electrical image shift: 12 m (WD: 8 mm)
Evacuation system:
System type: Fully automatic pneumatic-valve system
Ultimate vacuum levels: Specimen chamber: 7 x Pa
10-7 Pa in electron gun chamber
10-4 Pa in specimen chamber
Electron gun chamber:
IP1 1 x Pa or better
IP2 2 x Pa or better
IP3 7 x Pa or better
Vacuum pumps: ULVAC GLD-136
Electron optical system: (3) Ion pumps
Specimen chamber: Turbo molecular pump
Oil rotary pump
Protection devices:
Warning devices:
Power failure
Cooling-water interruption
Inadequate vacuum
Secondary electron image resolution:
1.0 nm at 15 kV, WD: 4 mm
1.4 nm at 1 kV, WD: 1.5 mm
Sample chamber:
Size: Type I stage
Max sample size: 100 mm Diameter
Stage motion:
3 Axis motorized
X/Y: 0 - 50 mm
Signal selection:
SE Signal
X-Ray signal
AUX Signal
UPS Unit
Chiller
FE-SEM Rotary pump
Main body:
Stage controller (ROM PCB)
EVAC Controller (ROM PCB)
(3) Ion pumps
SE Detector
Multi-aperture
Gun head cap
STP301H TMP Pump
STP301H TMP Controller
Solenoid valve assy
PC
Hard Disk Drive (HDD)
Operating system: Windows XP
HV Controller
Gun head unit
Case
Operation unit:
LCD Monitor
Keyboard
Mouse
Operation panel
Stage control trackball
ETC:
Ion coater rotary pump
LN2
UPS
EDS
Control HUB
EDS Controller
Operating system: Windows XP
Baking tool
Ion coater
HP Office Jet Pro C8194A Printer
Manuals included
4 kVA For voltage other than 100V AC
Power requirements: 100V AC (±10% ), Single phase, 50/60 Hz
2008 vintage.
HITACHI S-4800是一种扫描电子显微镜(SEM),既提供卓越的图像质量,又具有通用的分析能力。这种高端仪器设计用于一系列研究和工业应用,如材料和生命科学调查、样品分析、故障分析、截面和表面测量。HITACHI S 4800配备了钨丝电子发射器、可变压力(VP)和可变压力可变温度(VPVT)功能。VP和VPVT模式使样品能够在不同的压力水平和温度下查看,从而能够更深入和更准确地描述特征。此外,该显微镜还具有直径140mm的大探测面积,在二次电子图像(SEI)模式下具有高分辨率,高达1nm点分辨率。此外,先进的低真空模式(ALV)提供了在非导电材料上检测SEM图像的能力。灵活的S-4800设计使其能够用于多种技术,如反向散射电子(BSE)成像、EDX元素分析和WDS用于定性和定量元素分析。此外,立体声和3D成像功能提供了样本的全面表征。先进的成像包括实时和单色显示器,以及数字图像测量工具,以实现内部结构和表面特性的精确测量和指定。此外,较大的样品室和较高的提升级能够有效的样品处理和操作.S 4800还拥有广泛的配件,如一系列先进的探测器和电子柱升级,以及一个能够自动获取图像的自动成像系统。此外,先进的能量过滤有助于研究能量色散X射线信号。总体而言,HITACHI S-4800是一款功能强大的高端SEM,旨在满足各种研究和工业应用的需求。它提供了卓越的图像质量和先进的分析能力,通过其多用途的设计,使用户能够获得被分析样本的精确和准确的视图。
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