二手 HITACHI S-9220 #9200635 待售

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ID: 9200635
CD Scanning electron microscope, 8" System information: Work station Model: B180L O/S: HP Unix General specifications: SEMI/JEIDA standard orientation Flat or V notch wafers Measurement method: Cursor / Line profile Measurement range: 0.1µm ~ 2.0 µm Measurement repeatability: ±1% / 3 nm (3 sigma) whichever larger Throughput: 56 Wafers/hr Measured points: 1 Point/chip, 5 Chips/wafer Secondary electron image resolution: 3nm Image magnification: 500 ~ 300kx Electron optics system: Electron gun: Schottky emission Accelerating voltage: 500 ~ 1,600 V Lens system: Scintillator/photomultiplier detection system ExB Filter SE / BSE Electrons Objective lens aperture: Heating type movable aperture Fine adjustment possible Scanning coil: 2 stage electromagnetic deflection Stigmator coil: 8-pole electromagnetic type (X, Y axes) Probe current monitoring: Faraday cup incorporated, with automatic measurement Optical microscope: 1.2-mm-square visual field, monochrome image Stage: Movement range: X, Y: 0 ~ 200mm Driving method: Pulse motor Control/speed: Positioning contro Linear encoder Maximum speed: 100mm/s Loader: Wafer transfer: Cassette to loader chamber: Auto transfer via wafer transfer robot Loader chamber to stage: Auto evacuation and auto loading Wafer transfer robot system: Random access using two cassettes Wafer detection in cassette: Automatic detection via wafer searcher Chucking method: Vacuum chucking on back of wafer Orientation flat / V notch detection: Non-contact auto detection via optical sensor Control and display system: CRT: EWS 21 Type monitor display of SEM and OM images GUI Operation screen Wafer map Measured values Stage coordinates Scanning modes: TV Scan HR Scan Slow scan With auto brightness/contrast function Image Processing: Hardware processing using DSP (Option) Recording: Video printer output function (Option) Image filing function (Option) Safety device: Equipped with emergency off swith CD Measurement data processing system: File storage: Storage function for various setting parameters, measurement results Storage media: Hard disk (9.1GB) incorporated in EWS 3.5 Type magneto-optic disk 3.5" Floppy disk Data process function: Statistics output Worksheet system Output of measured values in real time graph Printout: 80 Character thermal printer Evacuation system: Full automatic Dry / Clean evacuation Vacuum pumps : (3) Ion pumps (2) Turbo molecular pumps (2) Oil rotary pumps Safety devices: Protective device against: Power failure Column vacuum level drop Dry air pressure drop Cooling water flow rate drop Grounding: 1000 or less (Single) Nitrogen: 200 ~ 680kPa Pipe outer diameter: 6mm Vacuum: P: 1.3 ~ 21.3 kPa or less Pipe outer diameter: 6mm Circulation cooling water: 98.1 ~ 196kPa Pipe outer diameter: 15mm Environmental conditions: Magnetic field: AC magnetic field: 0.3µT or less DC magnetic field: 0.1µT or less Vibration: Horizontal direction: 1Hz: 3µm (P-P) Max 2Hz: 0.7µm (P-P) Max 3Hz: 1.2µm (P-P) Max 4Hz: 2µm (P-P) Max 5Hz: 3µm (P-P) Max 10Hz: 3.5µm (P-P) Max Noise: Less than 75 dB Room temperature: 20 ~ 25°C (Δt = ±2°C) Humidity: 60% or less Utility: Power: 100 V, 200 V, 208 V, 230 VAC 6 kVA 50/60 Hz 1 Phase 2001 vintage.
HITACHI S-9220是一种最先进的扫描电子显微镜(SEM)。这种电子探针显微镜是分析结构到亚纳米分辨率的通用平台。它在1-2纳米范围内提供了出色的像素分辨率,并且优化了被检查样品的长度和广度的图像质量和分辨率。HITACHI S9220高达1,000,000倍震级的高放大倍率使研究人员能够仔细检查纳米级物体的最小细节。常规SEM需要一个真空室进行操作,S 9220也不例外;但是,它使用大型商用干式真空设备,可确保高可靠性,同时提供卓越的性能。这种真空系统限制了离子、空气分子和其他可能导致伪影出现在图像中的粒子的影响。超低真空(ULV)单元的使用使腔室内的压力保持更长的时间,允许从样品中收集更多的信息并产生更好的图像质量。HITACHI S 9220配备了一台成像机,该成像机包括在高能级发射电子的野外发射枪、将这些电子聚焦到样品上的冷凝器透镜、收集信号的检测器和处理图像的图像检测器。这种成像工具由于其精密透镜和高能电子可以很容易地穿透样品并映射其原子结构,因此提供了优越的性能。S-9220的样本阶段能够围绕4轴(x、y、z和旋转)移动样品,以精确操纵需要成像的所需区域。标本持有者允许标本的范围从大而重的样本到细腻而小的样本。此外,样品阶段还设有一个温度控制单元,在冷却过程中包含样品并分析其化学成分。S9220还包含两个测量工具来分析样品。第一个工具是能量色散X射线光谱(EDS)探测器。这个单位使试样的化学成分能够以非常高的精确度来测定。另一种工具是X射线衍射工具(XRD)。这个量规允许研究人员从不同角度和方向确定材料的结晶结构。总体而言,HITACHI S-9220是进行纳米物体详细分析的理想扫描电子显微镜。其庞大的商用干真空资产、高能电子成像模型以及多个阶段和工具使这种SEM可靠而精确,使研究人员能够轻松获得准确和高分辨率的图像。
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