二手 HITACHI SU-1510 #9351987 待售

Scanning Electron Microscope (SEM) Manual stage SE Resolutions: 3.0 nm (Vac 30 kV, WD 5 mm, High vacuum) 15 nm (Vac 3 kV, WD 5 mm, High vacuum) BSE Resolution: 4.0 nm (Vac 30 kV, WD 5 mm, 6 Pa) Magnification: 5x to 300,000x Electron source: Cartridge with tungsten hairpin filament Accelerating voltage: 0.3 kV to 30 kV Gun bias: Quad/self bias switching / Fixed bias continuous variable Beam alignment: 2-Stage electromagnetic deflection Lens system: 3-Stage electromagnetic lens reduction optical system Stigma corrector: 8-Pole electromagnetic XY style Scanning coil: 2-Stage electromagnetic deflection style Objective movable aperture: 4-Hole movable aperture (30, 50, 80, and 150 μm) Image shifting: ± 50 µm / greater (WD= 15 mm) X-Ray analysis position: WD = 15 mm, X-Ray extraction angle (TOA) = 35° Types of detector and image: Electron detector and electron image (High vacuum mode) 4-Way split semiconductor back-scattered electron detector and electron image (high/low vacuum mode) Movable range: X-axis: 0 to 80 mm Y-axis: 0 to 40 mm Z-axis: 5 to 35 mm R-axis: 360° T-axis: 20° to 90° Drive method: 5-axis and manual drive Accessories: Controller Monitor CPU Keyboard Mouse 2011 vintage.