二手 JEOL JEM 2100 #9185479 待售

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ID: 9185479
Analytical transmission electron microscope Specimen anti-contamination trap Point-to-point resolution: 0.25 nm (guaranteed by JEOL) Observed Au (002) 0.2039nm, Si (022) 0.19194nm Stage tilt angle: +/-30 degrees for X axis Controller: Double tilt power supply HXA Hard X-ray aperture Retainer EM-21150 for low background EDX analysis Free lens control 200kV Modes: TEM Microprobe TEM Nanoprobe STEM (Scanning transmission electron microscope) OXFORD SDD Thin-window energy dispersive X-ray (EDS) detector GATON Orius 1000 slow scan CCD camera With 2k x 4k Bright field (BF) High-angle annular dark field (HAADF) STEM Detectors: 35mm port Objective pole piece Capable of ±30° tilt Cryo-sample holder: -183°C Double-tilt: ±30° holder Background (Be) EDS holders Accelerating voltage: Maximum accelerating voltage: 200 kV Engineer alignments at 120kV, 200kV Operator alignment at 80kV Electron gun assembly: LaB6 Spare wehnelt assembly Spare DENKA filament – LKSH60SM3 Pole piece: High tilt analytical pole piece (HRP20) EM20720 Specimen holders take standard 3mm grid: JEOL Single tilt JEOL Tilting holder EM31630 +/-30 degrees for Y tilt axis GATAN Cryoholder Model: 636-J1622403N01HC +/-30 Degrees for Y tilt axis faraday cup with heater SATW Ultra-thin polymer window - window for detection of light elements GATAN Double tilt holder (phosphor bronze): Model: 646 +/-30 Degrees for Y tilt axis faraday cup Double tilt power supply TEM Mode: Low mag: 50x - 6,000x High mag: 2,000x - 1,500,000x SA Mag: 8,000x - 800kx Diffraction: 8cm - 200cm MDS Camera: Orius SC1000 CCD camera: 4k x 2k 4008x2670 Pixels interline device 9um x 9um Pixel size Binning 1x, 2x, 3x, 4x Operating temperature = +10ºC STEM Mode: Mag & AMAG modes Image resolution: 1.5 nm with HTP Bright field STEM at 200 kV Low mag: 100x to 15,000x High mag: 20,000x to 2,000,000x JEOL Bright field detector JEOL High angle annular dark field (HAADF) detector Rocking beam Nano probe: Alpha 1-5 Spot size 0.5nm-25nm EDS: Alpha 1-3 Spot size 0.5nm-25nm CBED: Alpha 1-9 Spot size 0.5nm-25nm EDS Detector: SDD 80 mm Solid angle: 0.13sr Resolution: Mn Ka 127eV F Ka 64eV C Ka 56eV Operating systems: Windows XP for JEOL TEM PC Windows XP for GATAN camera PC Windows 7 for OXFORD EDX PC KVMP Switch box for single wireless keyboard Single wireless mouse control Dual monitors Missing part: Gatan double tilt holder (be low background) +/-30 Degrees for Y tilt axis faraday Cup Double tilt power supply Power: 240V/32A 50Hz main All 240V PC run from JEOL transformer TEM is 115V Currently installed.
JEOL JEM 2100是一种扫描电子显微镜(SEM),彻底改变了电子显微镜的世界。它采用紧凑、节省空间的设计,使实验室工作空间最大化。这种尖端仪器能够产生高分辨率图像,非常适合深入分析。显微镜具有30 kV的最大加速电压和2 nA的电流速率,使其能够拍摄其样品的强大图像。它还配备了用户友好的软件,使用户更容易操作和动手培训。JEM 2100以钨丝、消色差物镜和高精度枪控系统为特色。钨丝发出的电子可以穿透样品,并揭示光学显微镜通常看不到的细节。这些电子被消色差物镜聚焦,然后通过枪支控制系统,将信号和图像迭加。JEOL JEM 2100提供多种扫描模式,以满足广泛的需求。角度解析二次电子图像(ARSEI)可用于分析样品上非常小的特征和表面地形。此外,扫描电子显微镜和能量色散X射线光谱(SEM/EDS)选项可以用来识别样品上的元素。这种先进的仪器甚至可用于自动化的工作场所生产线进行例行检查,或用于研究实验室进行批判性分析。JEM 2100还具有低噪声成像系统、出色的真空性能以及精确集中样品的高精度定位控制。JEOL JEM 2100是寻找先进可靠扫描电子显微镜者的终极选择。从用户友好的界面到强大的成像和数据收集能力,这款仪器非常适合需要市场上最好的电子显微镜的实验室。
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