二手 JEOL JEM 2100FC #293772644 待售

Scanning Transmission Electron Microscope (STEM) Aberration-corrected STEM Imaging Electron source: Schottky field-emission gun EDAX Octane T Optima windowless: 60 mm² SDD EDX Detector GATAN Imaging filter High Angle Annular Dark Field (HAADF) Bright-field Dark-field Weak-beam imaging Selected Area Diffraction (SAED) Electron Energy Loss Spectroscopy (EELS) Energy Dispersive X-Ray Spectroscopy (EDXS) Energy Filtered TEM (EFTEM) Operating voltage: 80 and 200 kV.