二手 JEOL JEM 2200FS #293587150 待售
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ID: 293587150
Transmission Electron Microscope (TEM)
Performance parameters:
FEG with ZrO/W(100) Schottky emitter
Point resolution: 0.23 nm
Line resolution: 0.10 nm 3-stage
Intermediate lens system: 4-stage
Projective: 2-stage
Rotation-free imaging
Innovative goniometer with 5-axis position control
Piezo drive directions: X, Y
Sample holder system with double O-Ring seal and ultra-clean high vacuum pump
Cold trap
Automatic heating system
Sub-control systems: High voltage, goniometer, control panel
Vibration damping type: Air mount
Screenless operation via HDTV Camera system 1344 x 1024 pixels
EM-FS:
In-column filter system
(4) Sector magnets
Motor controlled 4-fold input panel
Energy filtering: TEM, STEM
Isochromaticity: <1 eV via 2k CCD Chip
Geometric distortion: <1 %
Detector resolution: used camera system
Spectra CCD Camera, Film-negative
Spectroscopy:
Filter energy resolution: <0.15 eV
EELS spectra speed: up to 50ms / Spektrum
Dispersion detector level: 50-400u/eV (at 200 kV)
GATAN UltraScan 1000 approx. 0.28-0.035 eV/pixel
Readout speed: up to 10 spectra/sec
Motor-controlled energy selection slot
702-70P-FEF:
GATAN In-column filter
Ratio map
704-00P: EELS analysis (704,00P)
EM-20590: Electrode short voltages 200 kV
EM-07320: Motorized lens hood for HR, HT, CR or HC pole shoe
EM-20360:
Motorized Hard X-Ray Aperture
EDX analysis for UHR Polschuh
JEM-2200FS:
STEM
Digital raster transmission unit
EM-20670: Primary jet catcher
EM-24580: Dark field imaging detector system, STEM
EM-24630UH:
Dark field imaging detector system
STEM, EELS
EM-21301: Piezoelement controlled
994.20P.2:
GATAN UltraScan1000XP
CCD Camera 2048 x 2048 pixels 100/200keV
Specification:
Sensor: 2048 x 2048 Pixels (à 14um) Full Frame CCD
Scintillator: HCRTM Phosphor scintillator (P+)
Coupling: HCRTM Fiber optics
Binning: 1x, 2x, 4x, 8x
Readout speed: 4.0Mpix/sec (4x1MHz)
Frame Rate: 5fps at 4x binning, 512 x 512 pixels
Digitization: 16Bit
Readout noise: <20CCDe- at 1MHz
MTF: 25% at 1/2 Nyquist (100kV), 17% at 12 Nyquist (200kV)
Cooling temperature: < -24°C
Camera head
UltraScan camera housings
TEM Adapter
Post-Specimen shutter control
lEEE1394b Computer interface
IBM-Compatible computer system
Fully motorized bezels
TFT Monitor
Operating system: Windows
Power supply: 80, 100, 120, 160, 200 kV
PC.
JEOL JEM 2200FS是一种创新的扫描电子显微镜(SEM),能够产生高分辨率图像和样品的详细分析。JEM的高效电子光学2200FS提供高质量的图像,最终分辨率为1.2nm。高分辨率的二次成像和反向散射成像能力能够精确和详细地描述标本的原子水平特征。JEOL JEM 2200FS使用现场发射源,可确保高亮度和低噪声水平。此外,探头电流在1pA和10nA之间可调节,允许广泛的成像应用。光束偏转系统利用均匀的电磁场大小和广泛的偏转角度来校正任何试样倾斜或漂移。光束扫描模式和操作控制在控制电子束参数方面提供了相当大的灵活性,从而实现了惊人的分辨率和高放大率成像。JEM 2200FS的标本室可以容纳各种各样的样品,从常规样品到3D物体甚至生物样品。此外,该SEM还配备了一系列用于样品制备的自动涂层系统。这一自动化过程可实现高度的一致性和可重复性,从而确保正确准备样品进行分析。此外,JEOL JEM 2200FS支持多种信号探测器,包括二次电子探测器、反向散射电子探测器、信号电子探测器和能量色散X射线探测器。这些探测器设计用来捕捉样品组成的精细细节,允许进行深入分析。总体而言,JEM 2200FS是最好的SEM之一。其出色的电子光学、先进的检测能力、自动化涂层系统以及广泛的性能特性使其成为各种成像和分析任务的理想选择。
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