二手 JEOL JSM 6340F #9076781 待售

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ID: 9076781
优质的: 1998
FE Scanning Electron Microscope (FE-SEM) BSE Capability Noise canceler: Detector Grounding terminal: 1,100 Ω or less Pump: Ion pumps Oil rotary pump Oil diffusion pump Secondary electron image resolution: 15 kV: 1.2 nm 1 kV: 2.5 nm Magnification LM Mode: 25x to 2,000x Zoom mode (MAG) HR Mode: 500x to 650,000x (WD 8 mm) Electric optical system: Electron gun Type: Cold-cathode field emission Accelerating voltage: 0.5 to 30 kV 0.5 to 2.9 kV Variable in 0.01 kV steps 2.9 to 30 kV Variable in 0.1 kV steps Emission current: 4,8,12 µA Alignment: Mechanical horizontal shift Electromagnetic deflection Lens system: Condenser lens: (2) Stages Electromagnetic Zooming system Aperture angle Control Lens (ACL): Electromagnetic lens Electron Optical System (EOS) Operating modes Image scanning: High Resolution (HR) Low Magnification (LM) Alignment patterns (ALP) Focusable working distance: 2 to 25 mm Automatic focus: Image rotation compensator Dynamic focus: Objective lens apertures: 50, 70, 70, 110 µm in Diameter Stigmators Wobbler Specimen stage Type: Fully eucentric goniometer stage Specimen movement range X-Direction: 0-50 mm Y-Direction: 0-70 mm Z-Direction: 2, 3, 6, 8, 15 and 25 mm (Step wise change) Tilt: -5°C to 45°C Rotation: 360°C Endless Working distances: 2, 3, 6, 8, 15 and 25 mm Electron detector system: Detector Photo multiplier voltage Video amplifier control Contrast control Brightness control Back scattered electron detector: Imaging modes Detector Operation and display system Image data processing system Keyboard control Photographic recording system Scaler Vacuum system Safety devices Cooling water: Flow rate: 3 R. l/min or higher Pressure: 0.05 to 0.25 MPa Temperature: 20 ± 5°C Faucet: 1, ISO 7/1 Rc 1/4 Coupling / 1, 14 mm 0.0. Nozzle Drain: 1, ISO 711 Rc 1/4 Coupling / 1, Larger than 25 mm I.D. Nozzle Sample size: Maximum, 4" X-Direction: 50 mm Y-Direction: 70 mm Chamber: Airlock, 4" LN2 Cold trap, 4" No EDX Operating system: Windows 2000 Power supply: 200 V, 50/60 Hz, Single phase, 6 kVA 1998 vintage.
JEOL JSM 6340F是一种最先进的扫描电子显微镜(SEM)。它配备了一个纳米聚焦电子束柱,以及用于成像、分析和材料表征的多种特征。SEM旨在生成任何样品表面的清晰图像,无论其大小或复杂性如何。JEOL JSM-6340F配备了LaB6电子枪,产生能量高、散度低的电子。这使得电子束的精确聚焦能够创建即使是最小特征的锐利图像。该仪器还配备了先进的阻尼技术,可减少成像过程中的漂移和振动,确保准确性并消除伪影。SEM具有高灵敏度的闪烁体和移光片,能够以更高的放大倍率和分辨率成像。这样可以改进对组成和结构信息的检测。显微镜还具有一个索引设备,以便更快和更容易操作。该自动对准系统保证了光束的可靠和可重复对准。这样就不需要手动调整光束,从而大大节省了时间并提高了潜在的分辨率。JSM 6340 F的其他特性包括高速样本扫描单元、自动控制机和集成数字信号处理器。自动控制工具维持显微镜腔室的精确温度和湿度,为操作创造稳定的环境。集成数字信号处理器还允许高效的数据处理和图像分辨率。JEOL JSM 6340 F是需要最高精度和分辨率的应用的理想扫描电子显微镜。广泛的选择和功能使得这种最先进的显微镜几乎适合任何SEM成像应用。
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