二手 JEOL JSM 7401F #293751819 待售

Scanning Electron Microscope (SEM) SM 34080 Lower detector device SM 36120 In-column faraday cup SM 34100 Integrated beam current measurements DE-IR Infrared video camera for sample chamber SM 74071 High-resolution backscatter detector SM 74130 STEM Detector for bright and dark field measurements Operating system: XP SP2 2007 vintage.