二手 LEO / ZEISS Supra 40VP #293700639 待售
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ID: 293700639
Scanning Electron Microscope (SEM)
OXFORD INSTRUMENTS Inca synergy 350
Energy Dispersive X-ray microanalysis system (EDS)
HKL Premium Electron Backscatter Diffraction System (EBSD)
LEICA Cryo stage components
ZEISS / ATLAS 5 Array tomography package
Voltage: 0.1-30 kV
Detectors:
SE2 Secondary electron
In-lens SEM
Scanning Transmission Electron Microscopy (STEM)
Backscatter Detector (BSD)
Variable pressure mode SE.
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