二手 PHILIPS / FEI Quanta 200 #9307654 待售
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已售出
ID: 9307654
优质的: 2003
Scanning Electron Microscope (SEM)
Tungsten source
Electron optics:
Thermal emission SEM column
With dual-anode source emission geometry
Fixed objective aperture and through lens differential pumping
Filament lifetime: > 100 Hours
Resolution:
High vacuum:
3.0 nm at 30 kV
4.0 nm at 30 kV
10 nm at 3 kV
Low vacuum:
3.0 nm at 30 kV
4.0 nm at 30 kV
<12 nm at 3 kV
Extended vacuum mode (ESEM): - 3.0 nm at 30 kV (SE)
Accelerating voltage: 200 V to 30 kV
Probe current: up to 2μA
Detectors:
Everhardt thornley SED
Low vacuum SED (LFD)
Gaseous SED (GSED)
IR-CCD
Solid state BSED
Vacuum chamber:
High vacuum: < 6e^-4 Pa
Low vacuum: 10 to 130 Pa
ESEM Vacuum: 10 to 2,600 Pa
Vacuum system:
240 l/s TMP, PVP
Lens differential pumping
Beam gas path length: 10 mm / 2 mm
Chamber:
Left to right: 284 mm
Analytical WD: 10 mm
(8) Ports
EDX Take-off angle: 35°
4-Axis motorized stage:
Eucentric goniometer stage
X, Y: 50 mm
Z: 50 mm (25mm motorized)
T: -15° to +75° (Manual)
R: 360° Continuous
Repeatability: 2 μm
System control:
32-Bit graphical user interface
With keyboard and optical mouse
Image display: 19" LCD, SVGA 1280 x 1024
Single frame / 4-Quadrants image display
4-Quadrants live
Quanta started training CD
Image processor:
Up to 4096 x 3536 pixels
File type: TIFF (8- /16-bit)
Standard utilities:
Digital video recording
Temperature control
Image histogram and measurement
System option:
PC and LCD, 19"
Monitor and DVD R/W
Multi-functional control panel
Controlled Pettier cooled
Specimen stage
Controlled 1000°C heating stage
Controlled 1500°C heating stage
Remote control
Video printer
Specimen holder kit
EDS
WDS
EBSD
Stray AC magnetic fields:
Asynchronous: < 100 nT
Synchronous: < 300 nT
Power consumption: < 2.0kVA for basic microscope
Temperature range: 15-30°C
Relative humidity: Below 80% RH
Door width: 90 cm
Operating system: Windows XP
No compressed air or water cooling
Power supply: 230V (+6%, -10%), 50/60 Hz (+/- 1%)
2003 vintage.
PHILIPS/FEI Quanta 200扫描电子显微镜（SEM）是一种高级成像工具，用于在非常高的放大倍率下评估表面和小物体的结构特性。利用内置的STEM探测器,可以对非导电样品和导电样品进行详细分析。FEI Quanta 200配备了易于调节的双镜头柱，使用户能够以各种放大倍数精确采样各种样品。它有一个先进的分析系统，用于高度详细的图像分析，如自动粒子大小分析和自动元素分析。它还利用先进的成像系统和一系列反向散射探测器，允许对亚微米样品进行高分辨率成像。它具有一个柱内分析系统，可以检测和计算样品中的各种粒子和分子。飞利浦Quanta 200具有高性能电子光学元件,可实现更高分辨率的SEM成像。其高能电子枪产生高达200kV束电流，提供了极好的景深和图像对比度。它还具有高角度放大功能，使用户即使在某些高放大倍数下也能看到隐藏的结构或细节。Quanta 200配备了一个可以容纳多种样品类型的样品支架，包括导电和非导电标本。它还具有一系列电极选项,包括冷却级和温度监视器。这样可以更准确地检测元素信息。PHILIPS/FEI Quanta 200设计方便用户,它包括一个教程功能,可指导用户完成成像和分析过程。FEI Quanta 200是一个非常好的成像工具，对于那些需要分析微小细节，甚至在极高放大倍率下识别隐藏特征或结构的人来说。这是一个可靠和高效的扫描电子显微镜，可以提供大量的详细图像和数据。这是完美的那些希望分析任何种类的样品，从组件和零件到生物标本。
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