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ID: 293585905
Scanning Electron Microscope (SEM)
Dispersive X-Ray detector
Ultra-thin detector window
Backscatter electron detector
USB controller:
DC-Isolated USB 2.0 Interface
HV-VAC Controller:
DAC Uni / Bipolar: ± 10 V (8 x 16 bit)
ADC for emission (5 x 10 bit)
VAC
Operating voltages
(16) Digital inputs and outputs
Security link to vacuum system
Control power supply
Turn-on of power supply
Emergency turn-off of electronics at malfunction
Module for deflection coils:
(2) Single deflection systems
(4) Double deflection systems
Magnification: 4 step and 16 bit
Scan rotation
Scan shift fine
Correction of tilt
Orthogonality
Rotation offset
Module with bipolar power supplies:
DAC for current/voltage supplies (8 x 16 bit)
Beam shift
Tilt coils
Image shift coils
Stigmator coils (8 pole)
Filament imaging
Stigmator image
Power supply: 4 x ±500 mA, 4 x ±10 V
Module for objective lens and condenser lenses:
Unipolar power supply
Objective lens: 2 x 16 bit DAC (coarse, fine), maximum 6.5 A
(2) Condenser lenses: 16 bit DAC, maximum 6.5 A
Image system:
Maximum pixels: 16384 x 16384
Pixel clock: 200 ns
D/A Converter for analog input signals (4 x 12 bit)
Counter for mapping (12 x 16 bit)
Simultaneous acquisition
(4) Analogs
(12) Digital input signals
Image acquisition
Windows 2000: Up to 10 (x86, x64)
Full screen mode
Slow scan
Mapping
Oversampling for noiseless images: Up to 32000
Line averaging
Frame averaging
Reduced area scan
ROI Scan
Qualitative and quantitative with EDS/WDS
AVI Function
Signal monitor to control image signals
Trigger inputs and clock outputs for point
Mains synchronization for slow scan
Thumbnail bar for acquired images
Image processing:
Image browser
Loading and saving of images file types: TIFF, BMP, JPEG, PNG, GIF
Auto save function
Creation of image sections
Image rotation
Image labeling functions
SEM Parameters
Power supply:
Analog power supplies: ±15 V, +5 V, +12 V
Switching power supply for high power objective and condenser lenses
Module for PMTs: 2 x 0 to 1.5 kV
Module for scintillator: 12 kV
Grid voltage: 0 V to 400 V.
PHILIPS/FEI Quanta 400，简称Q400，是一种扫描电子显微镜（SEM），设计用于材料表征和法医分析。它具有一个场发射源-一个小的，局部电子源在SEM的心脏。这使仪器能够在广泛的样品类型上收集高分辨率电子图像、地图和光谱。Q 400是固态系统，因此不需要液氮冷却。该系统采用大型数字分辨率控制器，为样品输送精确的光束电流。对于成像,Q 400可以提供分辨率高达0.5nm的高对比度图像,从而能够准确确定表面地形。此外,它的SEM功能可用于通过EDS（能源色散光谱法）获取化学映射信息,从而能够在整个样品表面快速进行元素映射。为了确保最佳的SEM成像和分析，样品必须预制Q400提供的"标准虚拟"样品支架。这有助于减少或消除对样品的充电影响。利用胶体球体附着物可以研究表面之间的相互作用，使用测角仪可以收集晶体取向。在样本表面下方，Q400可以通过收集一系列图像来通过检索更大的区域来探索局部表面结构。然后可以将它们合并并缝合在一起。这种缝合能力使研究人员能够更详细地探讨更广泛的结构和组成信息领域。捕获SEM图像和EDS映射常常会引发许多问题。例如，样品的平均晶粒大小、微结构成分的大小和分布或任何其他形态或组成分析。Q 400支持许多可以回答这些问题的软件程序。FEI Quanta 400是一种用途广泛、可靠的扫描电子显微镜,具有多种功能,可用于从材料分析到法医调查的广泛应用。它的高分辨率成像、EDS映射、测角仪连接和表面成像能力使其领先于竞争对手。
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