二手 PHILIPS / FEI XL 30 Sirion #293614803 待售

FEG Scanning Electron Microscope (FEG SEM) EDAX ETD and BSE Detector Chiller Magnification: Up to 800,000x with 2 nm Resolution: 5 nm at 10 kV or higher 5 nm at 1 kV Electron source: SCHOTTKY Thermionic field emission electron gun Gun configuration control Beam acceleration voltage range: 0.2-30 kV Beam current range: 1 pA - 25 nA Specimen stage: Eucentric goniometer: 4-Axis (X, Y, Z and R) Motorized stage with full manual override Tilt range: -15° to 60° Specimen chamber diameter: 284 mm Vacuum: Automatic vacuum interlock Diffusion pump (Lower chamber) (2) Ion getter pumps (Gun chamber) Gun chamber: 2x10^-7 Pa Specimen chamber: 2x10^-5 Pa Vacuum regained: <5 minutes Scanning system: Survey mode Scan mode Scan rotation Magnification rage: 20x - 800,000x Analytical capability: Secondary Electron (SE) detector Back Scattered Electron (BSE) detector Energy Dispersive X-Ray Spectrometer (EDS) Manuals included Voltage range: 1.0 kV - 30.0 kV.