二手 TESCAN Amber X #293765134 待售
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ID: 293765134
优质的: 2018
Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
Standard specimen stage
Rocking stage
High resolution I-FIB+
Trackball
IR Camera
Opti GIS Pt
EDS Piezo shutter
Smart act nanomanipulator
Detectors:
E-T
BDT
HADF R-STEM
Decontaminator
LE-BSE with shutter
In-beam axial and multi detectors
2018 vintage.
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