二手 PHYSICAL ELECTRONICS TRIFT97 #293759391 待售
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ID: 293759391
Time Of Flight Secondary Ion Mass Spectrometer (TOF-SIMS)
Ion sources: Ga+, Cs+, O2+
Detection limit: ppm-ppb
Spatial resolution at imaging: >100 nm
Probing depth: 1-3 monolayers in static mode
Depth resolution: 0.5 nm with 500eV sputter gun
Mass range: 0-10.000 amu
Detectable elements: H-U.
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