二手 SCIENTIFIC ANALYSIS INSTRUMENTS / SAI MiniSIMS ToF #9062424 待售

System Mass Spectrometer: Time of Flight (ToF), compact reflectron geometry, secondary ion pulsing Primary Beam: Ga+, current ~3 nA, energy ~5 to 7 keV Expected Emitter lifetime > 200 emission μA hours Pumping System: Turbomolecular + diaphragm pumps Computer Hardware: Dedicated PC with (2) monitors Positive and negative secondary ion detection Secondary electron and secondary ion imaging Defocused primary beam for static SIMS analysis Dynamic SIMS capability Charge neutralization for insulating samples Integrated data processing software Data System Windows XP or 7 compatible Instrument control, spectrum and image acquisition and display Additional Options: (1) Spectral library with search facility (2) Enhanced Sample Handling 10 cm (4”) samples or multiple samples with automated analysis General: Size: True benchtop, < 0.80 m2 footprint + PC Supplies: Single phase mains electrical supply Power Requirements: 1.2kVA without PC, approximately 2.3kVA with PC Ambient Temperature: Between 15°C and 25°C Sample Handling: Sample Type: Vacuum-compatible solid, < 0.5 mm surface roughness Sample Size: < 12.5 mm diameter x < 6.5 mm thickness for conducting samples and < 9.5 mm diameter x < 5 mm thickness for insulating samples Sample Loading Time:~5 minutes for standard sample stage Optional Upgrade available: < 100 mm diameter and < 12 mm thickness or up to 31 standard samples Loading time ~35 minutes Performance: Base Pressure: < 1 x 10-6 mbar Mass Range: m/z = 1 to 1200 daltons Mass Resolution: m/dm > 650 @ m/z = 27 daltons (FWHM) Mass Accuracy: Better than 0.2% above m/z = 12 with internal spectrum calibration 100 Sensitivity I > 1 x 104 cps/nA, I = Σ (I(xMo+) + I( xMoO+)) Analysis Area: Defocused beam:- Fixed 2.7 +/- 0.3 mm diameter area Focused beam:- Minimum limited by primary beam (see spot size) Maximum 4.5 mm x 4.5 mm image area for conducting samples 1.5 mm x 1.5 mm image area for insulating samples Primary Beam Spot Size: < 10μm @ 3 nA / 6 keV Ga+ for conducting samples < 50μm @ 3 nA / 6 keV Ga+ for insulating samples.