二手 ASML XT 760F #9237243 待售
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ID: 9237243
晶圆大小: 12"
优质的: 2006
DUV Scanner, 12"
Locking kit
TAMIS (EMTA):
Z7 Offset: ±4.0 nm (-5.96)
Z8 Offset: ±4.0 nm (-1.11)
Z7 Tilt in X: ±2.0 nm/cm (-0.04)
Z9 Offset: ±4.0 nm (0.48)
SAMOS (EMCA):
SAMOS: ≤3% (1.74)
SLIT Uniformity (LUSU):
- / NA / S.In / S.Out / Control spec / Down spec / Result
Annular (M-Action) / 0.7 / 0.55 / 0.85 / 1.50% / 3.00% / 0.31
Conventional / 0.65 / 0 / 0.75 / 1.50% / 3.00% / 0.26
Conventional / 0.7 / 0 / 0.6 / 1.50% / 3.00% / 0.28
Model result parameter:
Best focus: ±0.015 (0.002)
Image height C1 (um): 0 ±0.015 (0.002)
Image height C2 (um): 0 ±0.015
Image height different (um): 0 ±0.015
Image tilt ry C1 (urad): 0 ±0.5 (-0.279)
Image tilt ry C2 (urad): 0 ±0.5
Image tiltry different (urad): 0 ±0.5
Intrafield:
Focus range chuck 1 Before: <120 nm (91.6)
Focus range chuck 2 Before: <120 nm
Focus range chuck 1 After: <120 nm (89)
Focus range chuck 2 After: <120 nm
Focus range C1 different (nm): 0 +15 (2.6)
Focus range C2 different (nm): 0 +15
Astigmatism range C1 different (nm): 0 ±5 (0.6)
Astigmatism range C2 different (nm): 0 ±5
Result after correction:
IPD Mean (nm): <120 (89)
IPD STDEV (nm): <10
Astigmatism mean (nm): <70 (36)
Astigmatism STDEV (nm): <10
Dose accuracy and repeatability performance (ODAR):
Dose accuracy: <2.0 (max) (1.416)
Dose repeatability: <0.5 (0.057)
CARL ZEISS SMT Lens
Charcoal filter
External interface module
Bottom module
Reticle stage
Covering panels frame parts
Covering panels frame MCAB
Covering panels
RSRC Cabinet
MCWC Cabinet
MDC Cabinet
LCWC Cabinet
Exhaust cabinet
Machine parts clean folder
Side channel blower
(6) Machine parts
Double stage
CYMER Laser not included.
ASML XT 760F是一种晶圆步进工具,设计用于集成电路生产中的光刻应用。它提供高分辨率和均匀性,与其他传统的光学晶片步进器相比,允许精确、可重复的成像。ASML XT:760F配备了专有的运动学运动设备,能够产生极其精确和平滑的运动来定位镜片和镜子。该运动系统的设计具有最大的精度和最小的横向级漂移值,能够在高频下工作,以实现稳定和可重复的成像过程。它还配备了两轴Pololu机器人执行器,专门为光刻应用中的精确运动而设计。XT 760 F利用高性能的数字检振扫描仪进行成像。此扫描仪的设计目的是提供稳定的成像过程,同时确保扫描仪镜像在X、Y和Z轴上的高精度移动。这款扫描仪还配备了能够实现高分辨率成像的光束成形模块。随附的软件模块和硬件功能可方便准确地控制和调整扫描仪。XT:760F配有高分辨率CCD照相机,设计用于在光刻完成后捕捉晶片的图像,以便测量IC的表面特征。相机还配备了先进的图像处理算法,旨在降低噪音,增强图像对比度。此外,相机装置被设计用来捕捉低热量噪声的图像,提供稳定的成像环境。XT 760F是一种高度自动化的晶圆步进器,可实现可靠和可重复的成像。它能够以高达25 nm的分辨率成像,曝光时间仅为几秒钟。该机器能够在晶片上实现一致的图像均匀性以及跨晶片的可靠重复性。此外,它是高效的,提供了多个晶片的同时成像。这样可以在保持高精度和高精度的同时实现最大吞吐量。
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