二手 KLA / TENCOR Alpha Step 100 #9016122 待售

ID: 9016122
Profilometer / Surface profiler Scan unit: Model number: 10-00020 Controller unit: Model number: 10-00030 Power requirements: 117 V - 60 Hz Features: Automatic leveling Measurements completed in less than 1 minute 1,000 Å full-scale No shock isolation required Mechanical, electronic and thermal stability Specifications: Measurement ranges (full-scale deflection): 1,000 å, 2,500 å, 5,000 å, 10 kå, 25 kå, 50 kå, 100 kå, 250 kå, 500 kå, 1,000 kå Resolution: 10 å (minimum detectable step) Auto zero: Recorder automatically starts at any preset level Horizontal magnification / scan speed / recorder speed: 50 x / 0.1 mm/sec 5 mm/sec 500 x / 0.01 mm/sec / 5 mm/sec 2500 x / 0.01 mm/sec / 25 mm/sec Scan length: 3 mm in either direction (6 mm total) Stylus: diamond 12.5 µ radius standard Tracking force: Factory-set 15-18 mg (1 mg minimum) Sample stage dimension: 190 mm (7.5") w x 127 mm (5") deep Sample stage movement: X-axis: 3 mm (12") Y-axis: 48 mm (1.9") Z-axis: 11 mm (46") plus (vertical) stylus lift Throat depth: 65 mm (2.54") allowing measurement anywhere on a 125-mm (5") Dia wafer Maximum acceptable sample thickness: 11 mm (46") Operational modes: Automatic leveling and scan Manual leveling and scan Automatic leveling and manual scan Optics: Non-inverted image, 22x magnification Illumination: Light-emitting diodes Chart recorder: Type: Thermal printing Chart speeds: 5 and 25 mm/sec Chart size: 5 cm (2") Continuous roll Linearity: ±1% full-scale Max drift vs temperature: 0.5 division/10°c Max drift vs time: 0.1 division/8 hrs Dimensions: Scan unit: 208 mm (8.2") w x 226 mm (8.9") h x 422 mm (16.6") d Control unit: 216 mm (8.5") w x 125 mm (4.9") h x 394 mm (15.5") d Weight: Scan unit: 7.7 kg (17 lbs) Control unit: 6.4 kg (14 lbs).
KLA/TENCOR Alpha Step 100是一种晶圆测试和计量设备,可用于纳米尺度特征的无损光学测量和3D地形。该系统能够精确测量半导体晶圆和其他基板上的器件结构、多图桉化层膜厚度和临界尺寸。KLA Alpha Step 100以扫描隧道显微镜(STM)和四单元干涉仪(QCI)为特色,精确测量多种参数。STM在真空环境中运行,允许以纳米级精度对表面特征进行成像。除了晶圆表面的3D地形特征外,QCI还测量纳米级薄膜厚度。该单元还拥有一个非接触表面剖面仪,它以2.5纳米图像分辨率捕获表面的3D图像。除表面粗糙度等材料特性外,轮廓仪还收集地形和表面数据。TENCOR Alpha Step 100能够检测到甚至最微妙的缺陷,并为晶圆测量和打印检查提供最高精度。它有一个先进的相移分析程序,可以检测过度暴露和不足暴露的问题。机器还包括一个分析包,用于测量临界尺寸和寻址线宽、线缘粗糙度、线宽变化以及层间迭加。Alpha Step 100可以与测量工具集成,用于其他应用程序,如过程监视和产量分析。此外,此工具可与自动转换功能一起使用,以实现高吞吐量测试。该资产还配备了一个计算机控制的光头,允许非接触式多样本对准和测量,能够在一个通道内进行高精度测试,该模型可实现完整的3D地形成像,而无需平面或晶圆级对焦校正。这对于晶圆鉴定和监控过程从工具到工具的漂移以及整个过程运行都至关重要。此外,KLA/TENCOR Alpha Step 100具有可编程晶片级,具有多个不同配置的样品,可优化不同模具尺寸的通量和精度,对半导体晶片测试非常有用。
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