二手 BRUKER NANOSTAR #9235860 待售
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ID: 9235860
优质的: 2013
Small Angle X-Ray Scattering (SAXS) system
Non-destructive: Investigation of 3 dimensional structures
Part number:
7KP28028MA
862-063701
862-842800
862-829400
PM1000
Part number: C79298A3158B46
Plug-in slit, 6 mm
Part number: 862-062201
Fe55 Calibration source
Part number: P5000110
Set of ten built-in nano particle models:
Basic geometrical models (Spherical, spherical shell, ellipsoidal, cylindrical)
Selected polymer models (Flexible and semi-flexible chains, gaussian star, spherical block copolymer micelle)
Tabletop:
(2) Stable granite tablets
Tabletop dimension: 3540 x 950 mm
Collimation system:
Diameters and distances:
Pinhole 1: 750 μm
Pinhole 2: 400 μm
Pinhole 3: 1000 μm
Distance pinhole 1 - Pinhole 2: 925 mm
Distance pinhole 2 - Pinhole 3: 485 mm
Copper anode
Power: 45 kV at 0.65 mA
Integrated MONTEL optics:
Length: 60 mm
Output divergence: 1 mrad
Output beam dimension: 0.64 mm
Output flux: 2 x 10^7 cps
Radiation tight housing with be-entrance and exit window enabling evacuation
(4) Manual setting screws
XL Sample chamber:
2-Dimensional VANTEC-2000 detector with mounting base
Beam path tube of 400 mm length with mounting base
Beam stop frame with two beam stops of 4.31 mm and 3.15 mm diameter
VANTEC-2000 Detector
True photon counting X-ray detector
Wide energy range: 4 keV up to 12 keV
Active area: 140 mm x 140 mm
Usable wavelength range: Cr-Ka to Cu-Ka (Factory set for Cu-Ka)
Energy resolution: <25 %
Operational mode:
2048 x 2048
1024 x 1024 / 512 x 512 Channels
Pixel size: 68 μm x 68 μm
Spatial resolution: < 100 μm RMS
Maximum global count rate: 10^6 cps
Maximum local count rate: 3 x 10³ cps/pixel
Background noise: < 5.0 10^-4 cps/mm²
Operational gas: Xe-CO2
Operating conditions:
Temperature: 15°C - 30°C
Humidity: Up to 80 % RH
Frame buffer:
Dedicated frame buffer PC
With proprietary parallel detector interface
Mouse and keyboard
Capacity of disk drives and CD-RW, DVD-ROM, hard disk
RAM: State of the art
User selectable frame display
Real color display of data
Graphical evaluation of one-dimensional data sets:
Display and comparison of measured and simulated data
Simple, interactive evaluation of SAXS measurements
Wide selection of commonly used axis scaling
Automatic fitting:
Different refinement methods for automatic evaluation:
Levenberg-Marquardt
Online display of intermediate results (Text and graphic)
Particle size distribution and change of c2 cost function
2013 vintage.
BRUKER NANOSTAR是X射线行业全球领先者BRUKER开发的X射线设备。它设计用于研究、工业和航空航天样品的无损分析,提供内部和表面结构的纳米尺度测量。NANOSTAR系统利用X射线源和检测元件的独特组合,使其即使在低剂量成像环境下也能获得500纳米分辨率的图像。X射线源是一种高度聚焦的钴-60光束,它精确地指向样品,同时避开单元的其他组件。此功能确保了出色的样品成像,并能够以正确的剂量获取详细的图像。BRUKER NANOSTAR机器还具有先进的数据收集、图像处理和分析功能。可以多种格式获取和存储数据,从而实现快速数据分析。图像处理工具可用于提高分辨率和对比度,使用户能够有效检查纳米尺度的特征。此外,内置分析工具可用于测量样品的形状、大小、孔隙度和其他特性。NANOSTAR X射线工具是对各种研究、工业和航空航天样品进行无损分析的有力工具。高分辨率成像和强大的数据处理能力使我们能够以微创的方式对复杂的样品结构进行详细的检查和分析。BRUKER NANOSTAR资产以其独特的X射线源和检测组件组合,在X射线无损分析行业中处于领先地位。
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