二手 CAMECA TXRF 8300 #9224127 待售

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製造商
CAMECA
模型
TXRF 8300
ID: 9224127
优质的: 2007
System Specimen chamber and wafer handling: Mini environment, class 1 Automatic centering and flat / Notch identification Automatic thickness variation compensation Automatic angle adjustment Independent from wafer bow or wedge Polar orientation independent of analyzed area X, Y, Z, Θ, Φ Wafer stage No vacuum chamber Organic chuck material Vacuum chucking during wafer displacement X-Ray system with: Motorized curved double multi layer monochromator Measurement of elemental impurities on Si-wafers Simultaneous measurement of >60 elements between Al and U Detection limits: < 5 x 109 atoms / cm² (e.g. for Ni) Angle adjustment of wafers to optimize signal / Background ratio Medium frequency x-ray generator, max. 3.5 kW High power fine-focus tubes System prepared for W and Mo tubes Sealed anode system Lifetime: 2,000 Hours SiLi Detector: With crystal: 80 mm² Effective sampling area: 70 mm² Energy resolution better: 150 eV Selectable time constants for variable resolution Digital detector electronics Digital pulse processing 4096 Channels ADC for spectrum analysis Pile-up rejector Escape peak subtraction Standard calibration wafer Standard droplet Ni: 1ng Computer control system: PC With 256 MB RAM FDD: 1.4 MB CD Burner HDD: 100 GB TFT Monitor, 17” 16 MB Monitor adapter with hardware acceleration Ethernet card: 10 / 100 MB Operating system: Windows NT Color ink printer Graphical User Interface (GUI) Easy set-up of measurement sequences Break function for introduction of emergency measurements Automatic optimization of filter setup Individual selection of analyzing parameters Automatic search routine for VPD droplets E-Diagnostics and remote servicing Fab automation GEM SECS Modem included Cassette stations: (2) Cassette stations, 6"-12" Front and side port Mix and match operation Different wafer sizes in an automatic run Clean room compatible cassette operation X-Ray tubes: W-Tube: 3000 W Excitation energy: Wlb: 9.67 keV / Wla: 8.40 keV Typically used for elements between Al - Zn and Nb - Ta Chiller: Separate water / Air or water / Water chiller Detector: Model no: 7163 Resolution: 150 Detector HV bias: -500 V Cryostat: Capacity: 7.5 Liters Consumption rate: <1 Liter / day Pre-amplifier: Type: OXFORD Sensitivity gain: 1.6 mV / keV FET Configuration: Substrate voltage: -16.9 V Heater voltage: 4.5 V Spare parts included: PLANAR / Multi layer block standard Translink PCI card Limit switch for DMT 100/65 Digital vacuum switch / Sensor OXFORD / ISIS 300 DXP 50 Detector Digimic for assembly 5001 u 5002.00.00 hub: 10 mm M-521.2S Linear Turntable DMT 100 mit motor PK244-02B MY-COM / C30/200 Precision switches DETECTOR ELECTRONIC / 5885/7163 Without translink card OMRON / Micro switch DSF OMRON / MY-COM Switch Wafer dish / Mess chuck 2007 vintage.
CAMECA TXRF 8300是一种X射线荧光(XRF)设备,非常适合微量元素表征。X射线荧光光谱法利用X射线光束将目标样品激发成特征X射线发射,然后进行测量以确定样品的元素组成。在许多需要进行非破坏性和元素特异性分析的情况下,这种技术是理想的。TXRF 8300将X射线荧光光谱法与先进的样品制备能力相结合,使研究人员和技术人员能够满足其特定的元素测量需求。该系统将优化的大功率X射线发生器与集成的样品制备能力结合在一起,后者是实现卓越分析性能的关键。该组合单元提供了无与伦比的精确度和精确度元素浓度范围从ppm到高百分比。样品制备附件,如困难材料样品套件(DMSK),使得分析具有挑战性的样品矩阵和消除繁琐的样品预分选要求成为可能。专用软件包xSort包含组织和优化XRF实验的必要功能。xSort软件有助于简化数据采集过程,自动选择最佳测量参数,然后保存测量设置以供将来参考。CAMECA TXRF 8300的许多特点之一是它能够在单个测量中对许多元素进行表征。这可能是因为仪器提供的光束很小。机器的最小梁直径为120 μ m,非常适合进行详细的表面积分析。最后,预配置的测量参数服务菜单旨在让科学家和技术人员以最高的准确度和效率分析各种样品类型。TXRF 8300利用自动对齐技术和智能软件,在没有人工干预的情况下将样品精确定位在舞台上。综上所述,CAMECA TXRF 8300由于能够提供无与伦比的精度和精确度,是微量元素表征和X射线荧光光谱分析的完美工具。凭借其集成的样品准备功能、较小的X射线光束大小以及自动对准和软件功能,该资产是科学家和技术人员的绝佳工具。
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