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ADVANTEST
T 5375
Tester Single head /DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURAT
208
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Memory tester With test head CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.512DR+ 320I/O(QUARTER)
155
热门产品
ADVANTEST
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Memory tester With test head CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.512DR+ 320I/O(QUARTER)
180
热门产品
ADVANTEST
T 5375
Tester Number of test head: 1 Configuration of test head Pin configuration 512DR+ 320I / O (quarte
176
热门产品
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T 5375
Dual head tester /DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURAT
222
热门产品
ADVANTEST
T 5375
Memory tester Pin: 2048DR+1280 I/O (Full) Single head DC: 1-36 CH PPS: 1-256 CH AC Frequency: 60Hz F
187
热门产品
ADVANTEST
T 5375
Tester Configuration of test head: Pin configuration: 1. 512DR+ 320I/O(QUARTER) 2.1024DR+ 640I/O(
203
热门产品
ADVANTEST
T 5375
Memory test system with Flash option and M6771 handlers = /DIAG/R [2J[1;1HBOARD-NAME/REVISION PROCES
231
热门产品
ADVANTEST
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Memory tester Test station 3712 Channels Dr: 2048 Channels I/O: 1280 Channels DC: 128 Channels LVDr:
179
热门产品
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Memory tester, parts system (2) Test heads Flash option (16) FMRA (BIR-026382X02) PM (BIR-026383) TH
214
热门产品
ADVANTEST
T 5375
Memory test system (2) ADVANTEST M 6771AD handlers Full options Configuration: = /DIAG/G SYSTEM
160
热门产品
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Memory tester Pin: 2048DR+1280 I/O(Full) Single head DC: 1-36CH PPS: 1-256CH AC Frequency: 60Hz Flas
151
热门产品
ADVANTEST
T 5375
Dual head tester SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1. 512D
157
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Memory testers SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.51
209
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