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ID: 293586981
Atomic Force Microscope (AFM)
TFT, 19"
Vacuum chuck
DTR Torsional resonance mode
VT-103-3K-2 Integrated acoustic / Vibration isolation enclosure
NanoScope IVA SPM Control station:
Quadrex Extender electronics with on-board lock-in amplifier
Q-Control
High-speed DSP and SPM computer interface electronics
(6) Analog-to-digital converters
(4) Digital-to-analog converters
Dual monitor color display resolution: 32-Bit, 2048 x 768 pixels
(3) Scanning axes resolution: 16-Bit
Operating system: Windows XP
CE Compliant
Oscillator reference signal:
Line sync (End-of-line)
Frame sync (End-of-frame)
Quadrex Lock-in
Scanning probe microscope:
Samples: Up to 200 mm diameter and 12 mm thick
Magnetic sample holder included for samples less than 15mm diameter and 6mm thick
TrakScan Laser tracking system
Inspectable area: 120 mm x 100 mm
Stage resolution: 2 µm
Vacuum pump
Silicone vibration pad
Motorized optical focus:
Range: 285x - 1285x
Viewing area: 150 µm - 675 µm
Resolution: 1.5 µm
Computer control LED illuminator
Scanning tunneling
Force modulation (air and fluid)
Tapping mode (fluid) microscopy
Nano indenting / Scratching, scanning thermal microscopy
Scanning capacitance microscopy
Repeatability:
Unidirectional: 3 µm (typical), 10 µm (maximum)
Bidirectional: 4 µm (X-axis) and 6 µm (Y-axis), typical
Dimension Hybrid XYZ SPM Microscope head:
Ultra low noise 3-axis closed loop scanner
Scanner
Horizontal imaging area: 90 µm x 90 µm (Nominal maximum)
Vertical range: 9 µm (Nominal), 8 µm (Nominal minimum) in imaging mode
Tip holder
TrakScan Optical lever position detection system
VT-102 Vibration isolation table:
Base with (4) air suspension columns
Required air pressure: 0.8 bar
Minimum door diameter: 70 cm
Size: 610 mm x 610 mm x 787 mm.
VEECO/DIGITAL INSTRUMENTS DIMENSION 3100是一种高功率、用途广泛且可靠的扫描电子显微镜(SEM)。这种最先进的显微镜专为科学和工业研究而设计,用于获取关于样品的物理、化学、结构和电气特性的准确和详细的图像和信息。该系统具有能量色散X射线检测器和改进的可变压力试样室。EDX检测器能够测量样品的元素组成,而可变压力室允许在无需疏散的情况下进行样品测试,从而提高用户效率和灵活性。VEECO Dimension 3100具有双光束和分析SEM模式,为用户提供了一系列功能和分析选项。双光束模式包括一个聚焦离子束(FIB)探测器,它允许精确改变样品结构以及成像埋藏特征。该系统的分析SEM模式提供了精确的结构、构图和尺寸特征,这要归功于其先进但用户友好的成像软件。该系统还包括令人印象深刻的配件选择,如反向散射电子(BSE)探测器、低温静止系统、纳米镜级和宽距离离子束探测器。这些附件能够对样品进行详细的动态分析和3D成像。DIGITAL INSTRUMENTS Dimension 3100的坚固性和可靠性使其成为从材料研究和质量控制到半导体器件开发等多种应用的理想仪器。Dimension 3100凭借其卓越的成像能力、集成的软件和多用途的配件,是一款可靠且用户友好的科学和工业研究工具。
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