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VEECO / DIGITAL INSTRUMENTS
Dimension 3100
Atomic Force Microscope (AFM) 840-006-106 Quadrex extender 910-000-009 Standard NS3S Microscope 840-
273
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VEECO / DIGITAL INSTRUMENTS
Dimension 3100
Atomic Force Microscope (AFM) Maximum sample size: 8” Diameter, 0.5” thick Inspection area: 100 x 12
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Dimension 3100
Atomic Force Microscope (AFM) Stage movement X and Y: 150 mm With 2 micron resolution Micron area vi
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Dimension 3100
Atomic Force Microscope (AFM) Main measurement system Missing parts: Computer Controller.
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Dimension 3100
Atomic force microscope, 6" X-Y Imaging area: ~90 um square Z Range: ~6 um Nanoscope controller Inte
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