二手SEIKO SMI 3200待售

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SEIKO SMI 3200 #9116789

SEIKO

SMI 3200

FIB System Advertised resolution: 4nm Currently achieved resolution: <5nm Load time: 2’33” Sample si
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SEIKO SMI 3200 #9095358

SEIKO

SMI 3200

Focused Ion Beam Scanning Electron Microscope (FIB SEM).
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