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JSM 6330F

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JEOL JSM 6330F #9164163

JEOL

JSM 6330F

Scanning electron microscope (SEM) Electron beam energy: 0.2-40 keV Secondary electron imaging: Re
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JEOL JSM 6330F #9131143

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Scanning electron microscope (SEM) BRUKER EDX Element analyzer (LN2 Free) E-Beam tip Currently wareh
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JEOL JSM 6330F #9071903

JEOL

JSM 6330F

Scanning Electron Microscope (SEM).
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