二手JEOL JSM 6330F待售

4 发现的结果
过滤器
全部清除
过滤器
4 结果
优质的
  • (1)
  • (3)
JEOL JSM 6330F #9041540

JEOL

JSM 6330F

Field Emission Scanning Electron Microscope (FE-SEM) With EDAX OXFORD INCA 250 EDS System OXFORD EDX
201
找不到你要找的?
JEOL JSM 6330F #9164163

JEOL

JSM 6330F

Scanning electron microscope (SEM) Electron beam energy: 0.2-40 keV Secondary electron imaging: Re
173
JEOL JSM 6330F #9131143

JEOL

JSM 6330F

Scanning electron microscope (SEM) BRUKER EDX Element analyzer (LN2 Free) E-Beam tip Currently wareh
280
JEOL JSM 6330F #9071903

JEOL

JSM 6330F

Scanning Electron Microscope (SEM).
171