二手KLA / TENCOR 4000 SURFSCAN待售

Name: KLA / TENCOR 4000 SURFSCAN
SKU: 4000 SURFSCAN
Availability: PreOrder

晶圆测试、计量

製造商

KLA / TENCOR

模型

4000 SURFSCAN

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7 结果

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4000 SURFSCAN

Wafer inspection system, 2"-6" Substrate thickness: Semi standard thickness High angle optics.

829

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Wafer inspection system Unpatterned wafer Resolution: 0.3 microns at 95% Capture based on latex cal

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Inspection system.

633

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Unpatterned wafer surface inspection tool Parts system.

694

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Wafer inspection system, 6".

657

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Unpatterned wafer inspection system, 6".

692

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Unpatterned wafer inspection system.

630